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Sakata, O, Yi, Min-Su, Matsuda, A, Liu, J, Sato, S, Akiba, S, Sasaki, A, Yoshimoto, M (2004) Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements. Applied Surface Science, 221. 450-454 doi:10.1016/s0169-4332(03)00961-9

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Reference TypeJournal (article/letter/editorial)
TitleStructural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements
JournalApplied Surface Science
AuthorsSakata, OAuthor
Yi, Min-SuAuthor
Matsuda, AAuthor
Liu, JAuthor
Sato, SAuthor
Akiba, SAuthor
Sasaki, AAuthor
Yoshimoto, MAuthor
Year2004 (January)Volume221
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(03)00961-9Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9905613Long-form Identifiermindat:1:5:9905613:1
GUID0
Full ReferenceSakata, O, Yi, Min-Su, Matsuda, A, Liu, J, Sato, S, Akiba, S, Sasaki, A, Yoshimoto, M (2004) Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements. Applied Surface Science, 221. 450-454 doi:10.1016/s0169-4332(03)00961-9
Plain TextSakata, O, Yi, Min-Su, Matsuda, A, Liu, J, Sato, S, Akiba, S, Sasaki, A, Yoshimoto, M (2004) Structural analysis of NiO ultra-thin films epitaxially grown on ultra-smooth sapphire substrates by synchrotron X-ray diffraction measurements. Applied Surface Science, 221. 450-454 doi:10.1016/s0169-4332(03)00961-9
In(n.d.) Applied Surface Science Vol. 221. Elsevier BV

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