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Li, Hairong, Zhang, Fujia, Liu, Su (2004) Surface and interface state analysis of the TPD/Alq3 using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Applied Surface Science, 225. 162-169 doi:10.1016/j.apsusc.2003.09.044

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Reference TypeJournal (article/letter/editorial)
TitleSurface and interface state analysis of the TPD/Alq3 using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM)
JournalApplied Surface Science
AuthorsLi, HairongAuthor
Zhang, FujiaAuthor
Liu, SuAuthor
Year2004 (March)Volume225
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2003.09.044Search in ResearchGate
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Mindat Ref. ID9905838Long-form Identifiermindat:1:5:9905838:8
GUID0
Full ReferenceLi, Hairong, Zhang, Fujia, Liu, Su (2004) Surface and interface state analysis of the TPD/Alq3 using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Applied Surface Science, 225. 162-169 doi:10.1016/j.apsusc.2003.09.044
Plain TextLi, Hairong, Zhang, Fujia, Liu, Su (2004) Surface and interface state analysis of the TPD/Alq3 using X-ray photoelectron spectroscopy (XPS) and atomic force microscopy (AFM). Applied Surface Science, 225. 162-169 doi:10.1016/j.apsusc.2003.09.044
In(n.d.) Applied Surface Science Vol. 225. Elsevier BV

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