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Brajpuriya, R., Tripathi, S., Sharma, A., Chaudhari, S.M., Phase, D.M., Gupta, Ajay, Shripathi, T., Leitenberger, W., Pietsch, U., Laxmi, N. (2007) Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface. Applied Surface Science, 253. 8584-8587 doi:10.1016/j.apsusc.2007.04.069

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Reference TypeJournal (article/letter/editorial)
TitleTemperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface
JournalApplied Surface Science
AuthorsBrajpuriya, R.Author
Tripathi, S.Author
Sharma, A.Author
Chaudhari, S.M.Author
Phase, D.M.Author
Gupta, AjayAuthor
Shripathi, T.Author
Leitenberger, W.Author
Pietsch, U.Author
Laxmi, N.Author
Year2007 (August)Volume253
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2007.04.069Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9910187Long-form Identifiermindat:1:5:9910187:5
GUID0
Full ReferenceBrajpuriya, R., Tripathi, S., Sharma, A., Chaudhari, S.M., Phase, D.M., Gupta, Ajay, Shripathi, T., Leitenberger, W., Pietsch, U., Laxmi, N. (2007) Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface. Applied Surface Science, 253. 8584-8587 doi:10.1016/j.apsusc.2007.04.069
Plain TextBrajpuriya, R., Tripathi, S., Sharma, A., Chaudhari, S.M., Phase, D.M., Gupta, Ajay, Shripathi, T., Leitenberger, W., Pietsch, U., Laxmi, N. (2007) Temperature dependent energy-dispersive X-ray diffraction and magnetic study of Fe/Al interface. Applied Surface Science, 253. 8584-8587 doi:10.1016/j.apsusc.2007.04.069
In(n.d.) Applied Surface Science Vol. 253. Elsevier BV

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Brajpuriya, R., Tripathi, S., Sharma, A., Shripathi, T., Chaudhari, S. M. (2006) Thickness dependent structural and magnetic properties of ultra-thin Fe/Al structures. The European Physical Journal B, 51 (1). 131-136 doi:10.1140/epjb/e2006-00185-x
Brajpuriya, R., Shripathi, T. (2009) Investigation of Fe/Al interface as a function of annealing temperature using XPS. Applied Surface Science, 255. 6149-6154 doi:10.1016/j.apsusc.2009.01.070
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Sharma, A., Brajpuriya, R., Tripathi, S., Chaudhari, S. M. (2006) An X-ray photoemission study of interfacial reaction during annealing of Mg/GaAs(100) interface. Surface and Interface Analysis, 38 (2). 59-61 doi:10.1002/sia.2174
Tripathi, S., Sharma, A., Shripathi, T. (2009) XPS study of annealing induced effects on surface and interface electronic properties of Si/Ge nanostructures. Applied Surface Science, 256. 489-494 doi:10.1016/j.apsusc.2009.07.054
Brajpuriya, R., Sharma, P., Jani, S., Kaimal, S., Shripathi, T., Lakshmi, N., Venugopalan, K. (2010) Correlation between microstructure, magnetic and electronic properties of Fe1−xAlx (0.2≤x≤0.6) alloys produced by arc melting. Applied Surface Science, 257. 10-16 doi:10.1016/j.apsusc.2010.06.008
Srivastava, M.K., Shripathi, T., Phase, D.M., Srivastava, P.C. (2010) X-ray diffraction and photoelectron spectroscopy study of swift heavy ion irradiated Mn/p-Si structure. Applied Surface Science, 256. 1664-1667 doi:10.1016/j.apsusc.2009.09.090
Gupta, Rachana, Gupta, Ajay, Chaudhari, S.M., Gupta, Mukul, Allenspach, P. (2004) Study of interfacial properties and its effect on magnetization behaviour of Fe/Ni multilayer structure. Applied Surface Science, 238. 254-261 doi:10.1016/j.apsusc.2004.05.230
Tripathi, S., Brajpuriya, R., Sharma, A., Shripathi, T., Chaudhari, S. M. (2006) Annealing induced structural changes in electron beam evaporated Si/Ge multilayers. The European Physical Journal Applied Physics, 34 (1). 13-19 doi:10.1051/epjap:2006028
Tripathi, S, Brajpuriya, R, Sharma, A, Shripathi, T, Chaudhari, S M (2006) Structural characterization of annealed Si/Ge nanostructures using Raman spectroscopy, XRR and AFM. Journal of Physics D: Applied Physics, 39. 4848-4854 doi:10.1088/0022-3727/39/22/016
 
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