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Qin, Yi, Feng, Tao, Li, Zhiqiang, Sun, Zhuo (2011) Structural, optical and electrical properties of amorphous silicon thin films prepared by sputtering with different targets. Applied Surface Science, 257. 7993-7996 doi:10.1016/j.apsusc.2011.04.053

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Reference TypeJournal (article/letter/editorial)
TitleStructural, optical and electrical properties of amorphous silicon thin films prepared by sputtering with different targets
JournalApplied Surface Science
AuthorsQin, YiAuthor
Feng, TaoAuthor
Li, ZhiqiangAuthor
Sun, ZhuoAuthor
Year2011 (July)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2011.04.053Search in ResearchGate
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Mindat Ref. ID9916263Long-form Identifiermindat:1:5:9916263:6
GUID0
Full ReferenceQin, Yi, Feng, Tao, Li, Zhiqiang, Sun, Zhuo (2011) Structural, optical and electrical properties of amorphous silicon thin films prepared by sputtering with different targets. Applied Surface Science, 257. 7993-7996 doi:10.1016/j.apsusc.2011.04.053
Plain TextQin, Yi, Feng, Tao, Li, Zhiqiang, Sun, Zhuo (2011) Structural, optical and electrical properties of amorphous silicon thin films prepared by sputtering with different targets. Applied Surface Science, 257. 7993-7996 doi:10.1016/j.apsusc.2011.04.053
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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