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Wang, Tao, Diao, Xungang, Wang, Xuan (2011) Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering. Applied Surface Science, 257. 9773-9779 doi:10.1016/j.apsusc.2011.06.010

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Reference TypeJournal (article/letter/editorial)
TitleInhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering
JournalApplied Surface Science
AuthorsWang, TaoAuthor
Diao, XungangAuthor
Wang, XuanAuthor
Year2011 (September)Volume257
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2011.06.010Search in ResearchGate
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Mindat Ref. ID9916610Long-form Identifiermindat:1:5:9916610:0
GUID0
Full ReferenceWang, Tao, Diao, Xungang, Wang, Xuan (2011) Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering. Applied Surface Science, 257. 9773-9779 doi:10.1016/j.apsusc.2011.06.010
Plain TextWang, Tao, Diao, Xungang, Wang, Xuan (2011) Inhomogeneous optoelectronic and microstructure property distribution across the substrate of ZnO:Al films deposited by room temperature magnetron sputtering. Applied Surface Science, 257. 9773-9779 doi:10.1016/j.apsusc.2011.06.010
In(n.d.) Applied Surface Science Vol. 257. Elsevier BV

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