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Pan, S.W., Zhou, Bi, Chen, S.Y., Li, Cheng, Huang, Wei, Lai, H.K. (2011) Optical property investigation of SiGe nanocrystals formed by electrochemical anodization. Applied Surface Science, 258. 30-33 doi:10.1016/j.apsusc.2011.07.141

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Reference TypeJournal (article/letter/editorial)
TitleOptical property investigation of SiGe nanocrystals formed by electrochemical anodization
JournalApplied Surface Science
AuthorsPan, S.W.Author
Zhou, BiAuthor
Chen, S.Y.Author
Li, ChengAuthor
Huang, WeiAuthor
Lai, H.K.Author
Year2011 (October)Volume258
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2011.07.141Search in ResearchGate
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Mindat Ref. ID9917461Long-form Identifiermindat:1:5:9917461:3
GUID0
Full ReferencePan, S.W., Zhou, Bi, Chen, S.Y., Li, Cheng, Huang, Wei, Lai, H.K. (2011) Optical property investigation of SiGe nanocrystals formed by electrochemical anodization. Applied Surface Science, 258. 30-33 doi:10.1016/j.apsusc.2011.07.141
Plain TextPan, S.W., Zhou, Bi, Chen, S.Y., Li, Cheng, Huang, Wei, Lai, H.K. (2011) Optical property investigation of SiGe nanocrystals formed by electrochemical anodization. Applied Surface Science, 258. 30-33 doi:10.1016/j.apsusc.2011.07.141
In(n.d.) Applied Surface Science Vol. 258. Elsevier BV

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