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Santhosh Kumar, T., Bhuyan, R.K., Pamu, D. (2013) Effect of post annealing on structural, optical and dielectric properties of MgTiO3 thin films deposited by RF magnetron sputtering. Applied Surface Science, 264. 184-190 doi:10.1016/j.apsusc.2012.09.168

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Reference TypeJournal (article/letter/editorial)
TitleEffect of post annealing on structural, optical and dielectric properties of MgTiO3 thin films deposited by RF magnetron sputtering
JournalApplied Surface Science
AuthorsSanthosh Kumar, T.Author
Bhuyan, R.K.Author
Pamu, D.Author
Year2013 (January)Volume264
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2012.09.168Search in ResearchGate
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Mindat Ref. ID9919618Long-form Identifiermindat:1:5:9919618:3
GUID0
Full ReferenceSanthosh Kumar, T., Bhuyan, R.K., Pamu, D. (2013) Effect of post annealing on structural, optical and dielectric properties of MgTiO3 thin films deposited by RF magnetron sputtering. Applied Surface Science, 264. 184-190 doi:10.1016/j.apsusc.2012.09.168
Plain TextSanthosh Kumar, T., Bhuyan, R.K., Pamu, D. (2013) Effect of post annealing on structural, optical and dielectric properties of MgTiO3 thin films deposited by RF magnetron sputtering. Applied Surface Science, 264. 184-190 doi:10.1016/j.apsusc.2012.09.168
In(n.d.) Applied Surface Science Vol. 264. Elsevier BV

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