Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2015) Corrigendum to “Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy” [Appl. Surf. Sci. 216 (2003) 8–14]. Applied Surface Science, 343. 213pp. doi:10.1016/j.apsusc.2015.02.147
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Corrigendum to “Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy” [Appl. Surf. Sci. 216 (2003) 8–14] | ||
Journal | Applied Surface Science | ||
Authors | Teraoka, Yuden | Author | |
Moritani, Kousuke | Author | ||
Yoshigoe, Akitaka | Author | ||
Year | 2015 (July) | Volume | 343 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/j.apsusc.2015.02.147Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9925314 | Long-form Identifier | mindat:1:5:9925314:1 |
GUID | 0 | ||
Full Reference | Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2015) Corrigendum to “Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy” [Appl. Surf. Sci. 216 (2003) 8–14]. Applied Surface Science, 343. 213pp. doi:10.1016/j.apsusc.2015.02.147 | ||
Plain Text | Teraoka, Yuden, Moritani, Kousuke, Yoshigoe, Akitaka (2015) Corrigendum to “Coexistence of passive and active oxidation for O2/Si(0 0 1) system observed by SiO mass spectrometry and synchrotron radiation photoemission spectroscopy” [Appl. Surf. Sci. 216 (2003) 8–14]. Applied Surface Science, 343. 213pp. doi:10.1016/j.apsusc.2015.02.147 | ||
In | (n.d.) Applied Surface Science Vol. 343. Elsevier BV |
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