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Hibino, Michio, Maruse, Susumu (1969) Rotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy. Japanese Journal of Applied Physics, 8 (3) 366-373 doi:10.1143/jjap.8.366

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Reference TypeJournal (article/letter/editorial)
TitleRotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy
JournalJapanese Journal of Applied Physics
AuthorsHibino, MichioAuthor
Maruse, SusumuAuthor
Year1969 (March)Volume8
Issue3
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.8.366Search in ResearchGate
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Mindat Ref. ID14977566Long-form Identifiermindat:1:5:14977566:5
GUID0
Full ReferenceHibino, Michio, Maruse, Susumu (1969) Rotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy. Japanese Journal of Applied Physics, 8 (3) 366-373 doi:10.1143/jjap.8.366
Plain TextHibino, Michio, Maruse, Susumu (1969) Rotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy. Japanese Journal of Applied Physics, 8 (3) 366-373 doi:10.1143/jjap.8.366
In(1969, March) Japanese Journal of Applied Physics Vol. 8 (3) Japan Society of Applied Physics

See Also

These are possibly similar items as determined by title/reference text matching only.

Hibino, Michio, Kuzuya, Mikio, Maruse, Susumu (1981) Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens. Japanese Journal of Applied Physics, 20 (4) 781-782 doi:10.1143/jjap.20.781
Uchikawa, Yoshiki, Kojima, Masayuki, Ichihashi, Mikio, Maruse, Susumu (1969) The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination. Japanese Journal of Applied Physics, 8 (4) 436-442 doi:10.1143/jjap.8.436
Shimoyama, Hiroshi, Ohshita, Akinori, Maruse, Susumu (1972) The Mean Brightness of the Electron Microscope Gun. Japanese Journal of Applied Physics, 11 (5) 743-753 doi:10.1143/jjap.11.743
Uchikawa, Yoshiki, Maruse, Susumu (1969) On the Electron Density Distribution in an Image Plane of an Axially-Symmetrical Lens System. Japanese Journal of Applied Physics, 8 (11) 1359-1360 doi:10.1143/jjap.8.1359
Ishikawa, Akira, Mizuno, Fumio, Uchikawa, Yoshiki, Maruse, Susumu (1973) High Resolution and Spectroscopic Cathodoluminescent Images in Scanning Electron Microscope. Japanese Journal of Applied Physics, 12 (2) 286-292 doi:10.1143/jjap.12.286
Maeda, Hiroshi (1969) Rotatable Anisotropy and Perpendicular Anisotropy of Annealed Electrodeposited Nickel Films. Japanese Journal of Applied Physics, 8 (6) 808 doi:10.1143/jjap.8.808
Shimoyama, Hiroshi, Ohshita, Akinori, Maruse, Susumu (1972) Relativistic Considerations on Electron Optical Brightness. Japanese Journal of Applied Physics, 11 (2) 150-157 doi:10.1143/jjap.11.150
Maruse, Susumu, Hiratake, Susumu, Ichihashi, Mikio (1970) Korrektur vom Öffnungsfehler der Elektronenlinse. Japanese Journal of Applied Physics, 9 (12) 1549-1550 doi:10.1143/jjap.9.1549
Hibino, Michio, Shimoyama, H., Maruse, S. (1989) A high-voltage scanning transmission electron microscope at Nagoya University. Journal of Electron Microscopy Technique, 12 (3). 296-304 doi:10.1002/jemt.1060120312
Kojima, M., Hibino, M., Maruse, S. (1963) Veranderung des Bildkontrastes im Elektronenemissionsmikroskop durch Blendenverschiebung. Japanese Journal of Applied Physics, 2 (6) 370-371 doi:10.1143/jjap.2.370
Maeda, Hiroshi (1970) Rotatable Anisotropy and Perpendicular Anisotropy of Annealed Electrodeposited Nickel Films. Japanese Journal of Applied Physics, 9 (3) 302-308 doi:10.1143/jjap.9.302
 
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