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Hibino, Michio, Kuzuya, Mikio, Maruse, Susumu (1981) Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens. Japanese Journal of Applied Physics, 20 (4) 781-782 doi:10.1143/jjap.20.781

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Reference TypeJournal (article/letter/editorial)
TitleCorrection of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens
JournalJapanese Journal of Applied Physics
AuthorsHibino, MichioAuthor
Kuzuya, MikioAuthor
Maruse, SusumuAuthor
Year1981 (April)Volume20
Issue4
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.20.781Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14984932Long-form Identifiermindat:1:5:14984932:8
GUID0
Full ReferenceHibino, Michio, Kuzuya, Mikio, Maruse, Susumu (1981) Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens. Japanese Journal of Applied Physics, 20 (4) 781-782 doi:10.1143/jjap.20.781
Plain TextHibino, Michio, Kuzuya, Mikio, Maruse, Susumu (1981) Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens. Japanese Journal of Applied Physics, 20 (4) 781-782 doi:10.1143/jjap.20.781
In(1981, April) Japanese Journal of Applied Physics Vol. 20 (4) Japan Society of Applied Physics

See Also

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Kuzuya, Mikio, Hibino, Michio, Maruse, Susumu (1984) Correction of the spherical aberration of the CTEM objective lens using a foil lens. Ultramicroscopy, 15 (3). 233-237 doi:10.1016/0304-3991(84)90044-5
Hibino, Michio, Maruse, Susumu (1969) Rotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy. Japanese Journal of Applied Physics, 8 (3) 366-373 doi:10.1143/jjap.8.366
Hanai, T., Yoshida, H., Hibino, M. (1998) Characteristics and effectiveness of a foil lens for correction of spherical aberration in scanning transmission electron microscopy. Journal of Electron Microscopy, 47 (3). 185-192 doi:10.1093/oxfordjournals.jmicro.a023579
Tonomura, Akira, Matsuda, Tsuyoshi, Endo, Junji (1979) Spherical-Aberration Correction of an Electron Lens by Holography. Japanese Journal of Applied Physics, 18 (7) 1373-1377 doi:10.1143/jjap.18.1373
Uchikawa, Yoshiki, Maruse, Susumu (1969) On the Electron Density Distribution in an Image Plane of an Axially-Symmetrical Lens System. Japanese Journal of Applied Physics, 8 (11) 1359-1360 doi:10.1143/jjap.8.1359
Uchikawa, Yoshiki, Kojima, Masayuki, Ichihashi, Mikio, Maruse, Susumu (1969) The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination. Japanese Journal of Applied Physics, 8 (4) 436-442 doi:10.1143/jjap.8.436
Tsuno, Katsushige, Taoka, Tadami (1983) Magnetic-Field-Free Objective Lens around a Specimen for Observing Fine Structure of Ferromagnetic Materials in a Transmission Electron Microscope. Japanese Journal of Applied Physics, 22. 1041-1047 doi:10.1143/jjap.22.1041
Nakasuji, Mamoru, Shimizu, Hiroyasu (1993) Spherical and Chromatic Aberration Correction using Aperture Lens -Computer Simulation-. Japanese Journal of Applied Physics, 32. 1290-1297 doi:10.1143/jjap.32.1290
Shimoyama, Hiroshi, Ohshita, Akinori, Maruse, Susumu (1972) The Mean Brightness of the Electron Microscope Gun. Japanese Journal of Applied Physics, 11 (5) 743-753 doi:10.1143/jjap.11.743
Maruse, Susumu, Hiratake, Susumu, Ichihashi, Mikio (1970) Korrektur vom Öffnungsfehler der Elektronenlinse. Japanese Journal of Applied Physics, 9 (12) 1549-1550 doi:10.1143/jjap.9.1549
Takahashi, Takeshi, Wang, Bin, Ye, Mao, Sato, Susumu (2007) Aberration Measurements of a Liquid Crystal Lens Prepared Using a Glass Lens and Liquid Crystal Layers. Japanese Journal of Applied Physics, 46 (5) 3013-3015 doi:10.1143/jjap.46.3013
 
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