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Maruse, Susumu, Hiratake, Susumu, Ichihashi, Mikio (1970) Korrektur vom Öffnungsfehler der Elektronenlinse. Japanese Journal of Applied Physics, 9 (12) 1549-1550 doi:10.1143/jjap.9.1549

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Reference TypeJournal (article/letter/editorial)
TitleKorrektur vom Öffnungsfehler der Elektronenlinse
JournalJapanese Journal of Applied Physics
AuthorsMaruse, SusumuAuthor
Hiratake, SusumuAuthor
Ichihashi, MikioAuthor
Year1970 (December)Volume9
Issue12
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.9.1549Search in ResearchGate
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Mindat Ref. ID14977881Long-form Identifiermindat:1:5:14977881:9
GUID0
Full ReferenceMaruse, Susumu, Hiratake, Susumu, Ichihashi, Mikio (1970) Korrektur vom Öffnungsfehler der Elektronenlinse. Japanese Journal of Applied Physics, 9 (12) 1549-1550 doi:10.1143/jjap.9.1549
Plain TextMaruse, Susumu, Hiratake, Susumu, Ichihashi, Mikio (1970) Korrektur vom Öffnungsfehler der Elektronenlinse. Japanese Journal of Applied Physics, 9 (12) 1549-1550 doi:10.1143/jjap.9.1549
In(1970, December) Japanese Journal of Applied Physics Vol. 9 (12) Japan Society of Applied Physics

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Uchikawa, Yoshiki, Kojima, Masayuki, Ichihashi, Mikio, Maruse, Susumu (1969) The Ion-Induced Emission Electron Microscope and an Image Contrast Due to Specimen Contamination. Japanese Journal of Applied Physics, 8 (4) 436-442 doi:10.1143/jjap.8.436
Shimoyama, Hiroshi, Ohshita, Akinori, Maruse, Susumu (1972) Relativistic Considerations on Electron Optical Brightness. Japanese Journal of Applied Physics, 11 (2) 150-157 doi:10.1143/jjap.11.150
Hibino, Michio, Maruse, Susumu (1969) Rotatable Magnetic Anisotropy in Electron-Microscope Specimens of Permalloy. Japanese Journal of Applied Physics, 8 (3) 366-373 doi:10.1143/jjap.8.366
Ishikawa, Akira, Mizuno, Fumio, Uchikawa, Yoshiki, Maruse, Susumu (1973) High Resolution and Spectroscopic Cathodoluminescent Images in Scanning Electron Microscope. Japanese Journal of Applied Physics, 12 (2) 286-292 doi:10.1143/jjap.12.286
Hibino, Michio, Kuzuya, Mikio, Maruse, Susumu (1981) Correction of the Spherical Aberration of the Objective Lens in a Conventional Transmission Electron Microscope by Means of a Foil Lens. Japanese Journal of Applied Physics, 20 (4) 781-782 doi:10.1143/jjap.20.781
Shimoyama, Hiroshi, Ohshita, Akinori, Maruse, Susumu (1972) The Mean Brightness of the Electron Microscope Gun. Japanese Journal of Applied Physics, 11 (5) 743-753 doi:10.1143/jjap.11.743
Ohmiya, Toshikazu, Suge, Yoshio, Namba, Susumu (1970) Reaction Temperature of HgS. Japanese Journal of Applied Physics, 9 (7) 840 doi:10.1143/jjap.9.840
Uchikawa, Yoshiki, Maruse, Susumu (1969) On the Electron Density Distribution in an Image Plane of an Axially-Symmetrical Lens System. Japanese Journal of Applied Physics, 8 (11) 1359-1360 doi:10.1143/jjap.8.1359
Takeda, Susumu, Yasuda, Akio (1970) Measurements of High Electron Densities by the TM010Cavity. Japanese Journal of Applied Physics, 9 (7) 806-811 doi:10.1143/jjap.9.806
Harasawa, Susumu, Kitahara, Akiharu, Saitoh, Masashi (1970) Thermoluminescence of Purified LiF Powder Exposed to Thermal Neutrons and Gamma Rays. Japanese Journal of Applied Physics, 9 (12) 1552-1553 doi:10.1143/jjap.9.1552
Yagi, Hisao, Inoue, Masasi, Tatsukawa, Toshiaki, Yaeguchi, Osami, Kato, Susumu (1970) Superconducting Wired-Wall Cavity for V-Band ENDOR Experiment. Japanese Journal of Applied Physics, 9 (12) 1534 doi:10.1143/jjap.9.1534
 
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