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Huang, Jui-Chien, Lin, Yueh-Chin, Tseng, Yu-Ling, Chen, Ke-Shian, Lu, Po-Chin, Lin, Mong-E, Chang, Edward-Yi (2010) A Cu-Metallized InGaP/GaAs Heterojunction Bipolar Transistor with Reliable Pd/Ge/Cu Ohmic Contact for Power Applications. Japanese Journal of Applied Physics, 49 (2) 20215 doi:10.1143/jjap.49.020215

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Reference TypeJournal (article/letter/editorial)
TitleA Cu-Metallized InGaP/GaAs Heterojunction Bipolar Transistor with Reliable Pd/Ge/Cu Ohmic Contact for Power Applications
JournalJapanese Journal of Applied Physics
AuthorsHuang, Jui-ChienAuthor
Lin, Yueh-ChinAuthor
Tseng, Yu-LingAuthor
Chen, Ke-ShianAuthor
Lu, Po-ChinAuthor
Lin, Mong-EAuthor
Chang, Edward-YiAuthor
Year2010 (February 5)Volume49
Issue2
PublisherJapan Society of Applied Physics
DOIdoi:10.1143/jjap.49.020215Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15034911Long-form Identifiermindat:1:5:15034911:4
GUID0
Full ReferenceHuang, Jui-Chien, Lin, Yueh-Chin, Tseng, Yu-Ling, Chen, Ke-Shian, Lu, Po-Chin, Lin, Mong-E, Chang, Edward-Yi (2010) A Cu-Metallized InGaP/GaAs Heterojunction Bipolar Transistor with Reliable Pd/Ge/Cu Ohmic Contact for Power Applications. Japanese Journal of Applied Physics, 49 (2) 20215 doi:10.1143/jjap.49.020215
Plain TextHuang, Jui-Chien, Lin, Yueh-Chin, Tseng, Yu-Ling, Chen, Ke-Shian, Lu, Po-Chin, Lin, Mong-E, Chang, Edward-Yi (2010) A Cu-Metallized InGaP/GaAs Heterojunction Bipolar Transistor with Reliable Pd/Ge/Cu Ohmic Contact for Power Applications. Japanese Journal of Applied Physics, 49 (2) 20215 doi:10.1143/jjap.49.020215
In(2010, February) Japanese Journal of Applied Physics Vol. 49 (2) Japan Society of Applied Physics


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