Siddik, Manzar, Biju, Kuyyadi P., Liu, Xinjun, Lee, Joonmyoung, Kim, Insung, Kim, Seonghyun, Lee, Wootae, Jung, Seungjae, Lee, Daeseok, Sadaf, Sharif, Hwang, Hyunsang (2011) Characterization of Resistive Switching States in W/Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ for a Submicron ($\phi 250$ nm) Via-Hole Structure. Japanese Journal of Applied Physics, 50 (10) 105802 doi:10.1143/jjap.50.105802
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Characterization of Resistive Switching States in W/Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ for a Submicron ($\phi 250$ nm) Via-Hole Structure | ||
| Journal | Japanese Journal of Applied Physics | ||
| Authors | Siddik, Manzar | Author | |
| Biju, Kuyyadi P. | Author | ||
| Liu, Xinjun | Author | ||
| Lee, Joonmyoung | Author | ||
| Kim, Insung | Author | ||
| Kim, Seonghyun | Author | ||
| Lee, Wootae | Author | ||
| Jung, Seungjae | Author | ||
| Lee, Daeseok | Author | ||
| Sadaf, Sharif | Author | ||
| Hwang, Hyunsang | Author | ||
| Year | 2011 (October 20) | Volume | 50 |
| Issue | 10 | ||
| Publisher | Japan Society of Applied Physics | ||
| DOI | doi:10.1143/jjap.50.105802Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 15036982 | Long-form Identifier | mindat:1:5:15036982:2 |
| GUID | 0 | ||
| Full Reference | Siddik, Manzar, Biju, Kuyyadi P., Liu, Xinjun, Lee, Joonmyoung, Kim, Insung, Kim, Seonghyun, Lee, Wootae, Jung, Seungjae, Lee, Daeseok, Sadaf, Sharif, Hwang, Hyunsang (2011) Characterization of Resistive Switching States in W/Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ for a Submicron ($\phi 250$ nm) Via-Hole Structure. Japanese Journal of Applied Physics, 50 (10) 105802 doi:10.1143/jjap.50.105802 | ||
| Plain Text | Siddik, Manzar, Biju, Kuyyadi P., Liu, Xinjun, Lee, Joonmyoung, Kim, Insung, Kim, Seonghyun, Lee, Wootae, Jung, Seungjae, Lee, Daeseok, Sadaf, Sharif, Hwang, Hyunsang (2011) Characterization of Resistive Switching States in W/Pr$_{0.7}$Ca$_{0.3}$MnO$_{3}$ for a Submicron ($\phi 250$ nm) Via-Hole Structure. Japanese Journal of Applied Physics, 50 (10) 105802 doi:10.1143/jjap.50.105802 | ||
| In | (2011, October) Japanese Journal of Applied Physics Vol. 50 (10) Japan Society of Applied Physics | ||
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