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Elder, J.H., Osborn, J., Kolasinski, W.A., Koga, R. (1988) A method for characterizing a microprocessor's vulnerability to SEU. IEEE Transactions on Nuclear Science, 35 (6) 1678-1681 doi:10.1109/23.25521

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Reference TypeJournal (article/letter/editorial)
TitleA method for characterizing a microprocessor's vulnerability to SEU
JournalIEEE Transactions on Nuclear Science
AuthorsElder, J.H.Author
Osborn, J.Author
Kolasinski, W.A.Author
Koga, R.Author
Year1988Volume35
Issue6
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
DOIdoi:10.1109/23.25521Search in ResearchGate
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Mindat Ref. ID15572022Long-form Identifiermindat:1:5:15572022:2
GUID0
Full ReferenceElder, J.H., Osborn, J., Kolasinski, W.A., Koga, R. (1988) A method for characterizing a microprocessor's vulnerability to SEU. IEEE Transactions on Nuclear Science, 35 (6) 1678-1681 doi:10.1109/23.25521
Plain TextElder, J.H., Osborn, J., Kolasinski, W.A., Koga, R. (1988) A method for characterizing a microprocessor's vulnerability to SEU. IEEE Transactions on Nuclear Science, 35 (6) 1678-1681 doi:10.1109/23.25521
In(1988, December) IEEE Transactions on Nuclear Science Vol. 35 (6) Institute of Electrical and Electronics Engineers (IEEE)

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Koga, R., Kolasinski, W.A., Osborn, J.V., Elder, J.H., Chitty, R. (1988) SEU test techniques for 256 K static RAMs and comparisons of upsets by heavy ions and protons. IEEE Transactions on Nuclear Science, 35 (6) 1638-1643 doi:10.1109/23.25512
Song, Y., Vu, K.N., Cable, J.S., Witteles, A.A., Kolasinski, W.A., Koga, R., Elder, J.H., Osborn, J.V., Martin, R.C., Ghoniem, N.M. (1988) Experimental and analytical investigation of single event, multiple bit upsets in poly-silicon load, 64 K*1 NMOS SRAMs. IEEE Transactions on Nuclear Science, 35 (6) 1673-1677 doi:10.1109/23.25520
Cusick, J., Koga, R., Kolasinski, W. A., King, C. (1985) SEU Vulnerability of the Zilog Z-80 and NSC-800 Microprocessors. IEEE Transactions on Nuclear Science, 32 (6) 4206-4211 doi:10.1109/tns.1985.4334095
Rollins, J.G., Tsubota, T.K., Kolasinski, W.A., Haddad, N.F., Rockett, L., Cerrila, M., Hennley, W.B. (1988) Cost-effective numerical simulation of SEU. IEEE Transactions on Nuclear Science, 35 (6) 1608-1612 doi:10.1109/23.25506
Rollins, J. G., Kolasinski, W. A., Marvin, D. C., Koga, R. (1986) Numerical Simulation of SEU Induced Latch-Up. IEEE Transactions on Nuclear Science, 33 (6) 1565-1570 doi:10.1109/tns.1986.4334642
Koga, R., Kolasinski, W.A. (1989) Heavy ion induced snapback in CMOS devices. IEEE Transactions on Nuclear Science, 36 (6) 2367-2374 doi:10.1109/23.45450
Fu, J. S., Weaver, H. T., Koga, R., Kolasinski, W. A. (1985) Comparison of 2D Memory SEU Transport Simulation with Experiments. IEEE Transactions on Nuclear Science, 32 (6) 4145-4149 doi:10.1109/tns.1985.4334083
Koga, R., Kolasinski, W. A., Marra, M. T., Hanna, W. A. (1985) Techniques of Microprocessor Testing and SEU-Rate Prediction. IEEE Transactions on Nuclear Science, 32 (6) 4219-4224 doi:10.1109/tns.1985.4334098
Flesner, L.D., Zuleeg, R., Kolasinski, W.A. (1988) Comparison of heavy ion and electron-beam upset data for GaAs SRAMs. IEEE Transactions on Nuclear Science, 35 (6) 1670-1672 doi:10.1109/23.25519
Koga, R., Katz, N., Pinkerton, S.D., Kolasinski, W.A., Oberg, D.L. (1990) Bevalac ion beam characterizations for single event phenomena. IEEE Transactions on Nuclear Science, 37 (6) 1923-1928 doi:10.1109/23.101210
Nichols, D. K., Smith, L. S., Price, W. E., Koga, R., Kolasinski, W. A. (1987) Recent Trends in Parts SEU Susceptibility from Heavy Ions. IEEE Transactions on Nuclear Science, 34 (6) 1332-1337 doi:10.1109/tns.1987.4337475
 
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