Reference Type | Journal (article/letter/editorial) |
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Title | Spectroscopic Ellipsometry in-situ Monitoring/Control of GaN Epitaxial Growth in MBE and MOVPE |
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Journal | physica status solidi (a) |
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Authors | Yoshikawa, A. | Author |
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Xu, K. | Author |
Taniyasu, Y. | Author |
Takahashi, K. | Author |
Year | 2002 (March) | Volume | 190 |
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Issue | 1 |
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Publisher | Wiley |
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DOI | doi:10.1002/1521-396x(200203)190:1<33::aid-pssa33>3.0.co;2-iSearch in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5087666 | Long-form Identifier | mindat:1:5:5087666:0 |
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GUID | 0 |
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Full Reference | Yoshikawa, A., Xu, K., Taniyasu, Y., Takahashi, K. (2002) Spectroscopic Ellipsometry in-situ Monitoring/Control of GaN Epitaxial Growth in MBE and MOVPE. physica status solidi (a), 190 (1). 33-41 doi:10.1002/1521-396x(200203)190:1<33::aid-pssa33>3.0.co;2-i |
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Plain Text | Yoshikawa, A., Xu, K., Taniyasu, Y., Takahashi, K. (2002) Spectroscopic Ellipsometry in-situ Monitoring/Control of GaN Epitaxial Growth in MBE and MOVPE. physica status solidi (a), 190 (1). 33-41 doi:10.1002/1521-396x(200203)190:13.0.co;2-i |
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In | (2002, March) physica status solidi (a) Vol. 190 (1) Wiley |
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