Khan, Aurangzeb, Yamaguchi, Masafumi, Bourgoin, Jacques C., Takamoto, Tatsuya (2002) Thermal annealing study of 1 MeV electron-irradiation-induced defects in n+p InGaP diodes and solar cells. Journal of Applied Physics, 91 (4). 2391-2397 doi:10.1063/1.1433936
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Thermal annealing study of 1 MeV electron-irradiation-induced defects in n+p InGaP diodes and solar cells | ||
Journal | Journal of Applied Physics | ||
Authors | Khan, Aurangzeb | Author | |
Yamaguchi, Masafumi | Author | ||
Bourgoin, Jacques C. | Author | ||
Takamoto, Tatsuya | Author | ||
Year | 2002 (February 15) | Volume | 91 |
Issue | 4 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.1433936Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 5113750 | Long-form Identifier | mindat:1:5:5113750:4 |
GUID | 0 | ||
Full Reference | Khan, Aurangzeb, Yamaguchi, Masafumi, Bourgoin, Jacques C., Takamoto, Tatsuya (2002) Thermal annealing study of 1 MeV electron-irradiation-induced defects in n+p InGaP diodes and solar cells. Journal of Applied Physics, 91 (4). 2391-2397 doi:10.1063/1.1433936 | ||
Plain Text | Khan, Aurangzeb, Yamaguchi, Masafumi, Bourgoin, Jacques C., Takamoto, Tatsuya (2002) Thermal annealing study of 1 MeV electron-irradiation-induced defects in n+p InGaP diodes and solar cells. Journal of Applied Physics, 91 (4). 2391-2397 doi:10.1063/1.1433936 | ||
In | (2002, February) Journal of Applied Physics Vol. 91 (4) AIP Publishing |
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