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Novikov, D V, Ohler, M, Kohler, R, Materlik, G (1995) Observation of defects in crystal surface layers by grazing-incidence diffraction X-ray topography. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/016

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Reference TypeJournal (article/letter/editorial)
TitleObservation of defects in crystal surface layers by grazing-incidence diffraction X-ray topography
JournalJournal of Physics D: Applied Physics
AuthorsNovikov, D VAuthor
Ohler, MAuthor
Kohler, RAuthor
Materlik, GAuthor
Year1995 (April 14)Volume28
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/28/4a/016Search in ResearchGate
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Mindat Ref. ID5665784Long-form Identifiermindat:1:5:5665784:5
GUID0
Full ReferenceNovikov, D V, Ohler, M, Kohler, R, Materlik, G (1995) Observation of defects in crystal surface layers by grazing-incidence diffraction X-ray topography. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/016
Plain TextNovikov, D V, Ohler, M, Kohler, R, Materlik, G (1995) Observation of defects in crystal surface layers by grazing-incidence diffraction X-ray topography. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/016
In(1995) Journal of Physics D: Applied Physics Vol. 28. IOP Publishing

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Kohler, R, Jenichen, B, Raidt, H, Bauser, E, Nagel, N (1995) Vertical stress in liquid-phase epitaxy Si layers on SiO2/Si evaluated by X-ray double-crystal topography. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/010
Rose, D, Pietsch, U, Gottschalch, V, Rhan, H (1995) Investigation of InAs single quantum wells buried in GaAs(001) using grazing incidence X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/048
Jergel, M, Holy, V, Majkova, E, Luby, S, Senderak, R (1995) Interface study of W-Si/Si and obliquely deposited W/Si multilayers by grazing-incidence high-resolution X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/047
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Ulyanenkov, A P, Stepanov, S A, Pietsch, U, Kohler, R (1995) A dynamical diffraction approach to grazing-incidence X-ray diffraction by multilayers with lateral lattice misfits. Journal of Physics D: Applied Physics, 28. 2522-2528 doi:10.1088/0022-3727/28/12/020
Jenichen, B, Wroblewski, T, Kohler, R (1995) Curvable collimator topography using the synchrotron source. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/052
Bocchi, C, Ferrari, C (1995) A study of thin buried layers in IIl-V compound heterostructures by high-resolution X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/032
Punegov, V I, Vishnjakov, Y V (1995) Dynamical theory of X-ray diffraction from damaged epitaxial layers with constant strain gradient. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/036
Holy, V, Baumbach, T, Bessiere, M (1995) Interface roughness in surface-sensitive X-ray methods. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/043
Matveev, V M, Manuilov, V, Matveev, V V (1995) Can dynamical effects in magnetic X-ray diffraction on spiral magnetic structures be observed?. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/054
Francesio, L, Franzosi, P, Landgren, G (1995) A high-resolution X-ray diffraction study in InGaAs/InP superlattices. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/033
 
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