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Rose, D, Pietsch, U, Gottschalch, V, Rhan, H (1995) Investigation of InAs single quantum wells buried in GaAs(001) using grazing incidence X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/048

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Reference TypeJournal (article/letter/editorial)
TitleInvestigation of InAs single quantum wells buried in GaAs(001) using grazing incidence X-ray diffraction
JournalJournal of Physics D: Applied Physics
AuthorsRose, DAuthor
Pietsch, UAuthor
Gottschalch, VAuthor
Rhan, HAuthor
Year1995 (April 14)Volume28
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/28/4a/048Search in ResearchGate
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Mindat Ref. ID5665816Long-form Identifiermindat:1:5:5665816:3
GUID0
Full ReferenceRose, D, Pietsch, U, Gottschalch, V, Rhan, H (1995) Investigation of InAs single quantum wells buried in GaAs(001) using grazing incidence X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/048
Plain TextRose, D, Pietsch, U, Gottschalch, V, Rhan, H (1995) Investigation of InAs single quantum wells buried in GaAs(001) using grazing incidence X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/048
In(1995) Journal of Physics D: Applied Physics Vol. 28. IOP Publishing

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Rose, D., Pietsch, U., Zeimer, U. (1997) Characterization of InxGa1−xAs single quantum wells, buried in GaAs[001], by grazing incidence diffraction. Journal of Applied Physics, 81 (6). 2601-2606 doi:10.1063/1.363924
Darowski, N, Paschke, K, Pietsch, U, Wang, K H, Forchel, A, Baumbach, T, Zeimer, U (1997) Identification of a buried single quantum well within surface structured semiconductors using depth resolved x-ray grazing incidence diffraction. Journal of Physics D: Applied Physics, 30. doi:10.1088/0022-3727/30/16/001
Novikov, D V, Ohler, M, Kohler, R, Materlik, G (1995) Observation of defects in crystal surface layers by grazing-incidence diffraction X-ray topography. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/016
Ulyanenkov, A P, Stepanov, S A, Pietsch, U, Kohler, R (1995) A dynamical diffraction approach to grazing-incidence X-ray diffraction by multilayers with lateral lattice misfits. Journal of Physics D: Applied Physics, 28. 2522-2528 doi:10.1088/0022-3727/28/12/020
Bocchi, C, Ferrari, C (1995) A study of thin buried layers in IIl-V compound heterostructures by high-resolution X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/032
Jergel, M, Holy, V, Majkova, E, Luby, S, Senderak, R (1995) Interface study of W-Si/Si and obliquely deposited W/Si multilayers by grazing-incidence high-resolution X-ray diffraction. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/047
Bilello, J C, Yalisove, S N, Rek, Z U (1995) The evolution of texture in thin films and multilayers via synchrotron transmission Laue and grazing-incidence X-ray scattering. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/058
Stommer, R, Grenzer, J, Fischer, J, Pietsch, U (1995) X-ray diffuse scattering in Langmuir-Blodgett multilayers prepared from fatty acid salts. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/042
Zeimer, U, Grenzer, J, Pietsch, U, Gramlich, S, Bugge, F, Smirnitzki, V, Weyers, M, Tränkle, G (2001) Investigation of strain-modulated InGaAs nanostructures by grazing-incidence x-ray diffraction and photoluminescence. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/338
Grigorian, S A, Grenzer, J, Feranchuk, S, Zeimer, U, Pietsch, U (2003) Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/346
Tapfer, L, Sciacovelli, P, Caro, L De (1995) Double- and triple-crystal X-ray diffraction analysis of semiconductor quantum wires. Journal of Physics D: Applied Physics, 28. doi:10.1088/0022-3727/28/4a/035
 
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