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Grigorian, S A, Grenzer, J, Feranchuk, S, Zeimer, U, Pietsch, U (2003) Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/346

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Reference TypeJournal (article/letter/editorial)
TitleGrazing-incidence diffraction study of strain-modulated single quantum well nanostructures
JournalJournal of Physics D: Applied Physics
AuthorsGrigorian, S AAuthor
Grenzer, JAuthor
Feranchuk, SAuthor
Zeimer, UAuthor
Pietsch, UAuthor
Year2003 (May 21)Volume36
PublisherIOP Publishing
DOIdoi:10.1088/0022-3727/36/10a/346Search in ResearchGate
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Mindat Ref. ID5669580Long-form Identifiermindat:1:5:5669580:9
GUID0
Full ReferenceGrigorian, S A, Grenzer, J, Feranchuk, S, Zeimer, U, Pietsch, U (2003) Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/346
Plain TextGrigorian, S A, Grenzer, J, Feranchuk, S, Zeimer, U, Pietsch, U (2003) Grazing-incidence diffraction study of strain-modulated single quantum well nanostructures. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/346
In(2002) Journal of Physics D: Applied Physics Vol. 36. IOP Publishing

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Zeimer, U, Grenzer, J, Pietsch, U, Gramlich, S, Bugge, F, Smirnitzki, V, Weyers, M, Tränkle, G (2001) Investigation of strain-modulated InGaAs nanostructures by grazing-incidence x-ray diffraction and photoluminescence. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/338
Grenzer, J., Zeimer, U., Grigorian, S. A., Feranchuk, S., Pietsch, U., Fricke, J., Kissel, H., Knauer, A., Weyers, M. (2004) Nanoengineering of lateral strain modulation in quantum well heterostructures. Physical Review B, 69 (12) doi:10.1103/physrevb.69.125316
Grenzer, J, Darowski, N, Geue, Th, Pietsch, U, Daniel, A, Rennon, S, Reithmaier, J P, Forchel, A (2001) Strain analysis and quantum well intermixing of a laterally modulated multiquantum well system produced by focused ion beam implantation. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/303
Darowski, N, Paschke, K, Pietsch, U, Wang, K H, Forchel, A, Baumbach, T, Zeimer, U (1997) Identification of a buried single quantum well within surface structured semiconductors using depth resolved x-ray grazing incidence diffraction. Journal of Physics D: Applied Physics, 30. doi:10.1088/0022-3727/30/16/001
Grigorian, S A, Grenzer, J, Pietsch, U, Vartanyants, I A (2003) Thermal diffuse scattering in grazing incidence diffraction. Journal of Physics: Condensed Matter, 15 (20). 3367-3374 doi:10.1088/0953-8984/15/20/301
Zeimer, U, Baumbach, T, Grenzer, J, Lübbert, D, Mazuelas, A, Pietsch, U, Erbert, G (1999) In situcharacterization of strain distribution in broad-area high-power lasers under operation by high-resolution x-ray diffraction and topography using synchrotron radiation. Journal of Physics D: Applied Physics, 32. doi:10.1088/0022-3727/32/10a/326
Zeimer, U., Grenzer, J., Grigorian, S., Fricke, J., Gramlich, S., Bugge, F., Pietsch, U., Weyers, M., Tränkle, G. (2003) Influence of lateral patterning geometry on lateral carrier confinement in strain-modulated InGaAs-nanostructures. physica status solidi (a), 195 (1). 178-182 doi:10.1002/pssa.200306286
Panzner, T, Leitenberger, W, Grenzer, J, Bodenthin, Y, Geue, Th, Pietsch, U, M hwald, H (2003) Coherence experiments at the energy-dispersive reflectometry beamline at BESSY II. Journal of Physics D: Applied Physics, 36. doi:10.1088/0022-3727/36/10a/319
Grenzer, J., Darowski, N., Pietsch, U., Daniel, A., Rennon, S., Reithmaier, J. P., Forchel, A. (2000) Grazing-incidence diffraction strain analysis of a laterally-modulated multiquantum well system produced by focused-ion-beam implantation. Applied Physics Letters, 77 (26). 4277-4279 doi:10.1063/1.1332410
Mazuelas, A, Dotor, M L, Golmayo, D, Zeimer, U, Baumbach, T, Luebbert, D, Grenzer, J, Baruchel, J (2001) Observation of dislocation generation in highly strained quantum well lasers during operation. Journal of Physics D: Applied Physics, 34. doi:10.1088/0022-3727/34/10a/324
Rose, D., Pietsch, U., Zeimer, U. (1997) Characterization of InxGa1−xAs single quantum wells, buried in GaAs[001], by grazing incidence diffraction. Journal of Applied Physics, 81 (6). 2601-2606 doi:10.1063/1.363924
 
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