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Yilmaz, Gökhan, Cansever, Hamza, Sagban, H. Muzaffer, Günes, Mehmet, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudi (2014) Reversible and irreversible effects after oxygen exposure in thick (>1 μm) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity. Canadian Journal of Physics, 92. 778-782 doi:10.1139/cjp-2013-0638

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Reference TypeJournal (article/letter/editorial)
TitleReversible and irreversible effects after oxygen exposure in thick (>1 μm) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity
JournalCanadian Journal of Physics
AuthorsYilmaz, GökhanAuthor
Cansever, HamzaAuthor
Sagban, H. MuzafferAuthor
Günes, MehmetAuthor
Smirnov, VladimirAuthor
Finger, FriedhelmAuthor
Brüggemann, RudiAuthor
Year2014 (July)Volume92
PublisherCanadian Science Publishing
DOIdoi:10.1139/cjp-2013-0638Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5996817Long-form Identifiermindat:1:5:5996817:7
GUID0
Full ReferenceYilmaz, Gökhan, Cansever, Hamza, Sagban, H. Muzaffer, Günes, Mehmet, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudi (2014) Reversible and irreversible effects after oxygen exposure in thick (>1 μm) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity. Canadian Journal of Physics, 92. 778-782 doi:10.1139/cjp-2013-0638
Plain TextYilmaz, Gökhan, Cansever, Hamza, Sagban, H. Muzaffer, Günes, Mehmet, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudi (2014) Reversible and irreversible effects after oxygen exposure in thick (>1 μm) silicon films deposited by VHF-PECVD on glass substrates investigated by dual beam photoconductivity. Canadian Journal of Physics, 92. 778-782 doi:10.1139/cjp-2013-0638
In(n.d.) Canadian Journal of Physics Vol. 92. Canadian Science Publishing

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Günes, Mehmet, Cansever, Hamza, Yilmaz, Gökhan, Sagban, Muzaffer H., Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2014) Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods. Canadian Journal of Physics, 92. 768-773 doi:10.1139/cjp-2013-0630
Cansever, Hamza, Günes, Mehmet, Yilmaz, Gökhan, Sagban, H. Muzaffer, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2014) Investigation of metastability and instability effects on the minority carrier transport properties of microcrystalline silicon thin films by using the steady-state photocarrier grating technique. Canadian Journal of Physics, 92. 763-767 doi:10.1139/cjp-2013-0629
Günes, Mehmet, Cansever, Hamza, Yilmaz, Gökhan, Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2012) Metastability effects in hydrogenated microcrystalline silicon thin films investigated by the dual beam photoconductivity method. Journal of Non-Crystalline Solids, 358 (17) 2074-2077 doi:10.1016/j.jnoncrysol.2012.01.063
Turan, Elif, Yilmaz, Gokhan, Smirnov, Vladimir, Finger, Friedhelm, Günes, Mehmet (2012) Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water. Japanese Journal of Applied Physics, 51. 70210 doi:10.1143/jjap.51.070210
Turan, Elif, Yilmaz, Gokhan, Smirnov, Vladimir, Finger, Friedhelm, Günes, Mehmet (2012) Rapid Reversible Degradation of Silicon Thin Films by a Treatment in Water. Japanese Journal of Applied Physics, 51 (7) 70210 doi:10.7567/jjap.51.070210
Saleh, Z.M., Nogay, G., Ozkol, E., Yilmaz, G., Sagban, M., Gunes, M., Turan, R. (2014) Atmospheric aging and light-induced degradation of amorphous and nanostructured silicon using photoconductivity and electron spin resonance. Canadian Journal of Physics, 92. 713-717 doi:10.1139/cjp-2013-0573
Reynolds, Steve, Michard, Stephan, Wang, Shuo, Smirnov, Vladimir (2014) Electronic properties of undoped microcrystalline silicon oxide films. Canadian Journal of Physics, 92. 753-757 doi:10.1139/cjp-2013-0618
Smirnov, V., Lambertz, A., Finger, F. (2014) Bifacial microcrystalline silicon solar cells with improved performance due to μc-SiOx:H doped layers. Canadian Journal of Physics, 92. 913-916 doi:10.1139/cjp-2013-0617
Ding, K., Aeberhard, U., Lambertz, A., Smirnov, V., Holländer, B., Finger, F., Rau, U. (2014) Impact of doped microcrystalline silicon oxide layers on crystalline silicon surface passivation. Canadian Journal of Physics, 92. 758-762 doi:10.1139/cjp-2013-0627
Smirnov, V., Lambertz, A., Tillmanns, S., Finger, F. (2014) p- and n-type microcrystalline silicon oxide (μc-SiOx:H) for applications in thin film silicon tandem solar cells. Canadian Journal of Physics, 92. 932-935 doi:10.1139/cjp-2013-0640
Baranov, E.A., Khmel, S.Ya., Zamchiy, A.O., Cheskovskaya, I.V., Sharafutdinov, M.R. (2014) Solid-phase crystallization of high growth rate amorphous silicon films deposited by gas-jet electron beam plasma CVD method. Canadian Journal of Physics, 92. 723-727 doi:10.1139/cjp-2013-0580
 
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