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Smirnov, V., Lambertz, A., Tillmanns, S., Finger, F. (2014) p- and n-type microcrystalline silicon oxide (μc-SiOx:H) for applications in thin film silicon tandem solar cells. Canadian Journal of Physics, 92. 932-935 doi:10.1139/cjp-2013-0640

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Reference TypeJournal (article/letter/editorial)
Titlep- and n-type microcrystalline silicon oxide (μc-SiOx:H) for applications in thin film silicon tandem solar cells
JournalCanadian Journal of Physics
AuthorsSmirnov, V.Author
Lambertz, A.Author
Tillmanns, S.Author
Finger, F.Author
Year2014 (July)Volume92
PublisherCanadian Science Publishing
DOIdoi:10.1139/cjp-2013-0640Search in ResearchGate
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Mindat Ref. ID5996819Long-form Identifiermindat:1:5:5996819:5
GUID0
Full ReferenceSmirnov, V., Lambertz, A., Tillmanns, S., Finger, F. (2014) p- and n-type microcrystalline silicon oxide (μc-SiOx:H) for applications in thin film silicon tandem solar cells. Canadian Journal of Physics, 92. 932-935 doi:10.1139/cjp-2013-0640
Plain TextSmirnov, V., Lambertz, A., Tillmanns, S., Finger, F. (2014) p- and n-type microcrystalline silicon oxide (μc-SiOx:H) for applications in thin film silicon tandem solar cells. Canadian Journal of Physics, 92. 932-935 doi:10.1139/cjp-2013-0640
In(n.d.) Canadian Journal of Physics Vol. 92. Canadian Science Publishing

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Smirnov, V., Lambertz, A., Finger, F. (2014) Bifacial microcrystalline silicon solar cells with improved performance due to μc-SiOx:H doped layers. Canadian Journal of Physics, 92. 913-916 doi:10.1139/cjp-2013-0617
Smirnov, V., Lambertz, A., Grootoonk, B., Carius, R., Finger, F. (2012) Microcrystalline silicon oxide (μc-SiOx:H) alloys: A versatile material for application in thin film silicon single and tandem junction solar cells. Journal of Non-Crystalline Solids, 358 (17) 1954-1957 doi:10.1016/j.jnoncrysol.2011.12.019
Lambertz, A., Finger, F., Holländer, B., Rath, J.K., Schropp, R.E.I. (2012) Boron-doped hydrogenated microcrystalline silicon oxide (μc-SiOx:H) for application in thin-film silicon solar cells. Journal of Non-Crystalline Solids, 358 (17) 1962-1965 doi:10.1016/j.jnoncrysol.2011.12.047
Ding, K., Aeberhard, U., Lambertz, A., Smirnov, V., Holländer, B., Finger, F., Rau, U. (2014) Impact of doped microcrystalline silicon oxide layers on crystalline silicon surface passivation. Canadian Journal of Physics, 92. 758-762 doi:10.1139/cjp-2013-0627
Lambertz, A., Grundler, T., Finger, F. (2011) Hydrogenated amorphous silicon oxide containing a microcrystalline silicon phase and usage as an intermediate reflector in thin-film silicon solar cells. Journal of Applied Physics, 109 (11). 113109pp. doi:10.1063/1.3592208
Reynolds, Steve, Michard, Stephan, Wang, Shuo, Smirnov, Vladimir (2014) Electronic properties of undoped microcrystalline silicon oxide films. Canadian Journal of Physics, 92. 753-757 doi:10.1139/cjp-2013-0618
Liang, Shin-Wei, Hsu, Hung-Jung, Hsu, Cheng-Hang, Tsai, Chuang-Chuang (2014) Development of plasma-enhanced chemical vapor deposition microcrystalline silicon oxide as a replacement for N-type or back transparent conducting oxide layers in amorphous silicon single-junction solar cells. Canadian Journal of Physics, 92. 924-927 doi:10.1139/cjp-2013-0631
Maynard, Brian R., Schiff, E.A. (2014) Thermodynamic limits of nanophotonic light trapping in thin film silicon solar cells. Canadian Journal of Physics, 92. 909-912 doi:10.1139/cjp-2013-0613
Astakhov, O., Smirnov, V., Carius, R., Pieters, B.E., Petrusenko, Yu., Borysenko, V., Finger, F. (2014) Dependence of open circuit voltage in a-Si:H and μc-Si:H solar cells on defect density in absorber layer varied by 2 MeV electron bombardment. Canadian Journal of Physics, 92. 905-908 doi:10.1139/cjp-2013-0610
Bittkau, K., Hoffmann, A., Carius, R. (2014) Improvement of light trapping in thin-film silicon solar cells by combining periodic and random interfaces. Canadian Journal of Physics, 92. 888-891 doi:10.1139/cjp-2013-0585
Günes, Mehmet, Cansever, Hamza, Yilmaz, Gökhan, Sagban, Muzaffer H., Smirnov, Vladimir, Finger, Friedhelm, Brüggemann, Rudolf (2014) Investigation of meta- and in-stability effects in hydrogenated microcrystalline silicon thin films by the steady-state measurement methods. Canadian Journal of Physics, 92. 768-773 doi:10.1139/cjp-2013-0630
 
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