Reference Type | Journal (article/letter/editorial) |
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Title | Experimental and numerical analysis of the multi-recessed gate structure for microwave silicon carbide power MESFETs |
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Journal | Chinese Physics B |
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Authors | Xiao-Chuan, Deng | Author |
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Zhen, Feng | Author |
Bo, Zhang | Author |
Zhao-Ji, Li | Author |
Liang, Li | Author |
Hong-Shu, Pan | Author |
Year | 2009 (July) | Volume | 18 |
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Publisher | IOP Publishing |
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DOI | doi:10.1088/1674-1056/18/7/067Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5999414 | Long-form Identifier | mindat:1:5:5999414:5 |
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GUID | 0 |
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Full Reference | Xiao-Chuan, Deng, Zhen, Feng, Bo, Zhang, Zhao-Ji, Li, Liang, Li, Hong-Shu, Pan (2009) Experimental and numerical analysis of the multi-recessed gate structure for microwave silicon carbide power MESFETs. Chinese Physics B, 18. 3018-3023 doi:10.1088/1674-1056/18/7/067 |
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Plain Text | Xiao-Chuan, Deng, Zhen, Feng, Bo, Zhang, Zhao-Ji, Li, Liang, Li, Hong-Shu, Pan (2009) Experimental and numerical analysis of the multi-recessed gate structure for microwave silicon carbide power MESFETs. Chinese Physics B, 18. 3018-3023 doi:10.1088/1674-1056/18/7/067 |
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In | (n.d.) Chinese Physics B Vol. 18. IOP Publishing |
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