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Huang, Hai-Li, Tang, Xiao-Yan, Guo, Hui, Zhang, Yi-Men, Wang, Yu-Tian, Zhang, Yu-Ming (2019) Simulation of SiC radiation detector degradation. Chinese Physics B, 28. 10701pp. doi:10.1088/1674-1056/28/1/010701

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Reference TypeJournal (article/letter/editorial)
TitleSimulation of SiC radiation detector degradation
JournalChinese Physics B
AuthorsHuang, Hai-LiAuthor
Tang, Xiao-YanAuthor
Guo, HuiAuthor
Zhang, Yi-MenAuthor
Wang, Yu-TianAuthor
Zhang, Yu-MingAuthor
Year2019 (January)Volume28
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/28/1/010701Search in ResearchGate
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Mindat Ref. ID6009752Long-form Identifiermindat:1:5:6009752:7
GUID0
Full ReferenceHuang, Hai-Li, Tang, Xiao-Yan, Guo, Hui, Zhang, Yi-Men, Wang, Yu-Tian, Zhang, Yu-Ming (2019) Simulation of SiC radiation detector degradation. Chinese Physics B, 28. 10701pp. doi:10.1088/1674-1056/28/1/010701
Plain TextHuang, Hai-Li, Tang, Xiao-Yan, Guo, Hui, Zhang, Yi-Men, Wang, Yu-Tian, Zhang, Yu-Ming (2019) Simulation of SiC radiation detector degradation. Chinese Physics B, 28. 10701pp. doi:10.1088/1674-1056/28/1/010701
In(n.d.) Chinese Physics B Vol. 28. IOP Publishing

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