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Bardeleben, H.J.von, Cantin, J.L., Gosset, L.G., Ganem, J.J., Trimaille, I., Rigo, S. (1999) Electron paramagnetic resonance spectra of interface defects in nitric oxide treated Si/SiO2. Journal of Non-Crystalline Solids, 245 (1) 169-174 doi:10.1016/s0022-3093(98)00862-x

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Reference TypeJournal (article/letter/editorial)
TitleElectron paramagnetic resonance spectra of interface defects in nitric oxide treated Si/SiO2
JournalJournal of Non-Crystalline Solids
AuthorsBardeleben, H.J.vonAuthor
Cantin, J.L.Author
Gosset, L.G.Author
Ganem, J.J.Author
Trimaille, I.Author
Rigo, S.Author
Year1999 (April)Volume245
Issue1
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(98)00862-xSearch in ResearchGate
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Mindat Ref. ID637864Long-form Identifiermindat:1:5:637864:0
GUID0
Full ReferenceBardeleben, H.J.von, Cantin, J.L., Gosset, L.G., Ganem, J.J., Trimaille, I., Rigo, S. (1999) Electron paramagnetic resonance spectra of interface defects in nitric oxide treated Si/SiO2. Journal of Non-Crystalline Solids, 245 (1) 169-174 doi:10.1016/s0022-3093(98)00862-x
Plain TextBardeleben, H.J.von, Cantin, J.L., Gosset, L.G., Ganem, J.J., Trimaille, I., Rigo, S. (1999) Electron paramagnetic resonance spectra of interface defects in nitric oxide treated Si/SiO2. Journal of Non-Crystalline Solids, 245 (1) 169-174 doi:10.1016/s0022-3093(98)00862-x
In(1999, April) Journal of Non-Crystalline Solids Vol. 245 (1) Elsevier BV

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Cantin, Jean-Louis, Jurgen von Bardeleben, Hans, Georges Gosset, Laurent, Ganem, Jean-Jacques, Trimaille, Isabelle (2001) Interface modification of ultrathin SiO2/Si(001) by nitric oxide treatments: a comparative electron paramagnetic resonance and nuclear reaction analysis study. Journal of Non-Crystalline Solids, 280 (1) 143-149 doi:10.1016/s0022-3093(00)00367-7
Cantin, J.L., von Bardeleben, H.J. (2002) An electron paramagnetic resonance study of the Si(100)/Al2O3 interface defects. Journal of Non-Crystalline Solids, 303 (1) 175-178 doi:10.1016/s0022-3093(02)00981-x
Jolly, F, Cantin, J.L, Rochet, F, Dufour, G, von Bardeleben, H.J (1999) Temperature effects on the Si/SiO2 interface defects and suboxide distribution. Journal of Non-Crystalline Solids, 245 (1) 217-223 doi:10.1016/s0022-3093(98)00864-3
Gosset, L. G., Ganem, J. J., von Bardeleben, H. J., Rigo, S., Trimaille, I., Cantin, J. L., Ã…kermark, T., Vickridge, I. C. (1999) Formation of modified Si/SiO2 interfaces with intrinsic low defect concentrations. Journal of Applied Physics, 85 (7). 3661-3665 doi:10.1063/1.369730
Pacchioni, Gianfranco, Vitiello, Mirko (1999) Infra-red, electron paramagnetic resonance and X-ray photoemission spectral properties of point defects in silica from first-principle calculations. Journal of Non-Crystalline Solids, 245 (1) 175-182 doi:10.1016/s0022-3093(98)00888-6
Åkermark, T., Gosset, L. G., Ganem, J.-J., Trimaille, I., Vickridge, I., Rigo, S. (1999) Time dependence of the oxygen exchange O2↔SiO2 at the SiO2–Si interface during dry thermal oxidation of silicon. Journal of Applied Physics, 86 (2). 1153-1155 doi:10.1063/1.370858
Gosset, L.G., Damlencourt, J.-F., Renault, O., Rouchon, D., Holliger, Ph., Ermolieff, A., Trimaille, I., Ganem, J.-J., Martin, F., Séméria, M.-N. (2002) Interface and material characterization of thin Al2O3 layers deposited by ALD using TMA/H2O. Journal of Non-Crystalline Solids, 303 (1) 17-23 doi:10.1016/s0022-3093(02)00958-4
Nebel, F, Jourdain, M (1999) On the correlation between interface defects, positive oxide charge and hole fluence throughout the oxide. Journal of Non-Crystalline Solids, 245 (1) 67-72 doi:10.1016/s0022-3093(98)00872-2
Chaneliere, C., Autran, J.L., Four, S., Devine, R.A.B., Balland, B. (1999) Theoretical and experimental study of the conduction mechanism in Al/Ta2O5/SiO2/Si and Al/Ta2O5/Si3N4/Si structures. Journal of Non-Crystalline Solids, 245 (1) 73-78 doi:10.1016/s0022-3093(98)00873-4
Rao, A. Srinivasa, Sreedhar, B., Rao, J. Lakshmana, Lakshman, S.V.J. (1992) Electron paramagnetic resonance and optical absorption spectra of Mn2+ ions in alkali zinc borosulphate glasses. Journal of Non-Crystalline Solids, 144. 169-174 doi:10.1016/s0022-3093(05)80397-7
Courtot-Descharles, A., Paillet, P., Leray, J.L. (1999) Theoretical study using density functional theory of defects in amorphous silicon dioxide. Journal of Non-Crystalline Solids, 245 (1) 154-160 doi:10.1016/s0022-3093(98)00860-6
 
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