Erman, M., Frijlink, P. M. (1983) Interface analysis by spectroscopic ellipsometry of Ga1−xAlxAs‐GaAs heterojunctions grown by metal organic vapor phase epitaxy. Applied Physics Letters, 43 (3). 285-287 doi:10.1063/1.94328
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Interface analysis by spectroscopic ellipsometry of Ga1−xAlxAs‐GaAs heterojunctions grown by metal organic vapor phase epitaxy | ||
Journal | Applied Physics Letters | ||
Authors | Erman, M. | Author | |
Frijlink, P. M. | Author | ||
Year | 1983 (August) | Volume | 43 |
Issue | 3 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.94328Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8472585 | Long-form Identifier | mindat:1:5:8472585:7 |
GUID | 0 | ||
Full Reference | Erman, M., Frijlink, P. M. (1983) Interface analysis by spectroscopic ellipsometry of Ga1−xAlxAs‐GaAs heterojunctions grown by metal organic vapor phase epitaxy. Applied Physics Letters, 43 (3). 285-287 doi:10.1063/1.94328 | ||
Plain Text | Erman, M., Frijlink, P. M. (1983) Interface analysis by spectroscopic ellipsometry of Ga1−xAlxAs‐GaAs heterojunctions grown by metal organic vapor phase epitaxy. Applied Physics Letters, 43 (3). 285-287 doi:10.1063/1.94328 | ||
In | (1983, August) Applied Physics Letters Vol. 43 (3) AIP Publishing |
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