Reference Type | Journal (article/letter/editorial) |
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Title | Defects in (111) HgTe grown by molecular beam epitaxy |
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Journal | Applied Physics Letters |
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Authors | Feldman, R. D. | Author |
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Nakahara, S. | Author |
Austin, R. F. | Author |
Boone, T. | Author |
Opila, R. L. | Author |
Wynn, A. S. | Author |
Year | 1987 (October 19) | Volume | 51 |
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Issue | 16 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.98742Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8481194 | Long-form Identifier | mindat:1:5:8481194:1 |
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|
GUID | 0 |
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Full Reference | Feldman, R. D., Nakahara, S., Austin, R. F., Boone, T., Opila, R. L., Wynn, A. S. (1987) Defects in (111) HgTe grown by molecular beam epitaxy. Applied Physics Letters, 51 (16). 1239-1241 doi:10.1063/1.98742 |
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Plain Text | Feldman, R. D., Nakahara, S., Austin, R. F., Boone, T., Opila, R. L., Wynn, A. S. (1987) Defects in (111) HgTe grown by molecular beam epitaxy. Applied Physics Letters, 51 (16). 1239-1241 doi:10.1063/1.98742 |
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In | (1987, October) Applied Physics Letters Vol. 51 (16) AIP Publishing |
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