Vote for your favorite mineral in #MinCup25! - Pollucite vs. Tugtupite
It's the cesium #pollucite against the optical changeling #tugtupite for this match.
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Huang, C.-F., Yang, Y.-J., Peng, C.-Y., Yuan, F., Liu, C. W. (2006) Mechanical strain effect of n-channel polycrystalline silicon thin-film transistors. Applied Physics Letters, 89 (10). 103502pp. doi:10.1063/1.2344855

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleMechanical strain effect of n-channel polycrystalline silicon thin-film transistors
JournalApplied Physics Letters
AuthorsHuang, C.-F.Author
Yang, Y.-J.Author
Peng, C.-Y.Author
Yuan, F.Author
Liu, C. W.Author
Year2006 (September 4)Volume89
Issue10
PublisherAIP Publishing
DOIdoi:10.1063/1.2344855Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID8549259Long-form Identifiermindat:1:5:8549259:4
GUID0
Full ReferenceHuang, C.-F., Yang, Y.-J., Peng, C.-Y., Yuan, F., Liu, C. W. (2006) Mechanical strain effect of n-channel polycrystalline silicon thin-film transistors. Applied Physics Letters, 89 (10). 103502pp. doi:10.1063/1.2344855
Plain TextHuang, C.-F., Yang, Y.-J., Peng, C.-Y., Yuan, F., Liu, C. W. (2006) Mechanical strain effect of n-channel polycrystalline silicon thin-film transistors. Applied Physics Letters, 89 (10). 103502pp. doi:10.1063/1.2344855
In(2006, September) Applied Physics Letters Vol. 89 (10) AIP Publishing

See Also

These are possibly similar items as determined by title/reference text matching only.

Yang, Y.-J., Ho, W. S., Huang, C.-F., Chang, S. T., Liu, C. W. (2007) Electron mobility enhancement in strained-germanium n-channel metal-oxide-semiconductor field-effect transistors. Applied Physics Letters, 91 (10). 102103pp. doi:10.1063/1.2779845
Brotherton, S. D., Glasse, C., Glaister, C., Green, P., Rohlfing, F., Ayres, J. R. (2004) High-speed, short-channel polycrystalline silicon thin-film transistors. Applied Physics Letters, 84 (2). 293-295 doi:10.1063/1.1639137
Mariucci, L., Valletta, A., Gaucci, P., Fortunato, G., Templier, F. (2006) Hot-carrier effects in p-channel polycrystalline silicon thin film transistors. Applied Physics Letters, 89 (18). 183518pp. doi:10.1063/1.2378587
Wang, M. C., Chang, T. C., Liu, Po-Tsun, Xiao, R. W., Lin, L. F., Li, Y. Y., Yeh, F. S., Chen, J. R. (2007) n+-doped-layer-free microcrystalline silicon thin film transistors fabricated with the CuMg as source/drain metal. Applied Physics Letters, 91 (2). 22113pp. doi:10.1063/1.2749847
Chen, Y.-T., Lan, H.-S., Hsu, W., Fu, Y.-C., Lin, J.-Y., Liu, C. W. (2011) Strain response of high mobility germanium n-channel metal-oxide-semiconductor field-effect transistors on (001) substrates. Applied Physics Letters, 99 (2). 22106pp. doi:10.1063/1.3604417
Wang, M. C., Chang, T. C., Liu, Po-Tsun, Xiao, R. W., Lin, L. F., Li, Y. Y., Huang, F. S., Chen, J. R. (2007) Suppression of Schottky leakage current in island-in amorphous silicon thin film transistors with the Cuāˆ•CuMg as source/drain metal. Applied Physics Letters, 91 (6). 62103pp. doi:10.1063/1.2767147
Peng, C.-Y., Huang, C.-F., Fu, Y.-C., Yang, Y.-H., Lai, C.-Y., Chang, S.-T., Liu, C. W. (2009) Comprehensive study of the Raman shifts of strained silicon and germanium. Journal of Applied Physics, 105 (8). 83537pp. doi:10.1063/1.3110184
Powell, M. J., Easton, B. C., Hill, O. F. (1981) Amorphous siliconā€silicon nitride thinā€film transistors. Applied Physics Letters, 38 (10). 794-796 doi:10.1063/1.92166
Xian, H. J., Cao, C. R., Shi, J. A., Zhu, X. S., Hu, Y. C., Huang, Y. F., Meng, S., Gu, L., Liu, Y. H., Bai, H. Y., Wang, W. H. (2017) Flexible strain sensors with high performance based on metallic glass thin film. Applied Physics Letters, 111 (12). 121906pp. doi:10.1063/1.4993560
Su, H. L., Huang, S. Y., Chiang, Y. F., Huang, J. C. A., Kuo, C. C., Du, Y. W., Wu, Y. C., Zuo, R. Z. (2011) Unusual high-temperature ferromagnetism of PbPd0.81Co0.19O2 nanograin film. Applied Physics Letters, 99 (10). 102508pp. doi:10.1063/1.3634070
Angelis, C. T., Dimitriadis, C. A., Farmakis, F. V., Brini, J., Kamarinos, G., Miyasaka, M. (2000) Threshold voltage of excimer-laser-annealed polycrystalline silicon thin-film transistors. Applied Physics Letters, 76 (17). 2442-2444 doi:10.1063/1.126370
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are Ā© OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833ā€“844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 8, 2025 16:06:17
Go to top of page