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Chèze, C., Geelhaar, L., Trampert, A., Riechert, H. (2010) In situ investigation of self-induced GaN nanowire nucleation on Si. Applied Physics Letters, 97 (4). 43101pp. doi:10.1063/1.3464956

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Reference TypeJournal (article/letter/editorial)
TitleIn situ investigation of self-induced GaN nanowire nucleation on Si
JournalApplied Physics Letters
AuthorsChèze, C.Author
Geelhaar, L.Author
Trampert, A.Author
Riechert, H.Author
Year2010 (July 26)Volume97
Issue4
PublisherAIP Publishing
DOIdoi:10.1063/1.3464956Search in ResearchGate
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Mindat Ref. ID8589768Long-form Identifiermindat:1:5:8589768:3
GUID0
Full ReferenceChèze, C., Geelhaar, L., Trampert, A., Riechert, H. (2010) In situ investigation of self-induced GaN nanowire nucleation on Si. Applied Physics Letters, 97 (4). 43101pp. doi:10.1063/1.3464956
Plain TextChèze, C., Geelhaar, L., Trampert, A., Riechert, H. (2010) In situ investigation of self-induced GaN nanowire nucleation on Si. Applied Physics Letters, 97 (4). 43101pp. doi:10.1063/1.3464956
In(2010, July) Applied Physics Letters Vol. 97 (4) AIP Publishing


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