Reference Type | Journal (article/letter/editorial) |
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Title | In situ investigation of self-induced GaN nanowire nucleation on Si |
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Journal | Applied Physics Letters |
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Authors | Chèze, C. | Author |
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Geelhaar, L. | Author |
Trampert, A. | Author |
Riechert, H. | Author |
Year | 2010 (July 26) | Volume | 97 |
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Issue | 4 |
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Publisher | AIP Publishing |
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DOI | doi:10.1063/1.3464956Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 8589768 | Long-form Identifier | mindat:1:5:8589768:3 |
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GUID | 0 |
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Full Reference | Chèze, C., Geelhaar, L., Trampert, A., Riechert, H. (2010) In situ investigation of self-induced GaN nanowire nucleation on Si. Applied Physics Letters, 97 (4). 43101pp. doi:10.1063/1.3464956 |
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Plain Text | Chèze, C., Geelhaar, L., Trampert, A., Riechert, H. (2010) In situ investigation of self-induced GaN nanowire nucleation on Si. Applied Physics Letters, 97 (4). 43101pp. doi:10.1063/1.3464956 |
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In | (2010, July) Applied Physics Letters Vol. 97 (4) AIP Publishing |
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