Akatsu, Hiroyuki, Ohdomari, Iwao (1990) HRTEM observation of the Si/SiO2 interface. Applied Surface Science, 41. 357-364 doi:10.1016/0169-4332(89)90085-8
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | HRTEM observation of the Si/SiO2 interface | ||
Journal | Applied Surface Science | ||
Authors | Akatsu, Hiroyuki | Author | |
Ohdomari, Iwao | Author | ||
Year | 1990 (January) | Volume | 41 |
Publisher | Elsevier BV | ||
DOI | doi:10.1016/0169-4332(89)90085-8Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 9894955 | Long-form Identifier | mindat:1:5:9894955:1 |
GUID | 0 | ||
Full Reference | Akatsu, Hiroyuki, Ohdomari, Iwao (1990) HRTEM observation of the Si/SiO2 interface. Applied Surface Science, 41. 357-364 doi:10.1016/0169-4332(89)90085-8 | ||
Plain Text | Akatsu, Hiroyuki, Ohdomari, Iwao (1990) HRTEM observation of the Si/SiO2 interface. Applied Surface Science, 41. 357-364 doi:10.1016/0169-4332(89)90085-8 | ||
In | (n.d.) Applied Surface Science Vol. 41. Elsevier BV |
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