Vote for your favorite mineral in #MinCup25! - Pectolite vs. Haüyne
It's a pair of striking blue beauties as #pectolite the uncrushable faces off against #hauyne, the phoenix from volcanic ashes!
Log InRegister
Quick Links : The Mindat ManualThe Rock H. Currier Digital LibraryMindat Newsletter [Free Download]
Home PageAbout MindatThe Mindat ManualHistory of MindatCopyright StatusWho We AreContact UsAdvertise on Mindat
Donate to MindatCorporate SponsorshipSponsor a PageSponsored PagesMindat AdvertisersAdvertise on Mindat
Learning CenterWhat is a mineral?The most common minerals on earthInformation for EducatorsMindat ArticlesThe ElementsThe Rock H. Currier Digital LibraryGeologic Time
Minerals by PropertiesMinerals by ChemistryAdvanced Locality SearchRandom MineralRandom LocalitySearch by minIDLocalities Near MeSearch ArticlesSearch GlossaryMore Search Options
Search For:
Mineral Name:
Locality Name:
Keyword(s):
 
The Mindat ManualAdd a New PhotoRate PhotosLocality Edit ReportCoordinate Completion ReportAdd Glossary Item
Mining CompaniesStatisticsUsersMineral MuseumsClubs & OrganizationsMineral Shows & EventsThe Mindat DirectoryDevice SettingsThe Mineral Quiz
Photo SearchPhoto GalleriesSearch by ColorNew Photos TodayNew Photos YesterdayMembers' Photo GalleriesPast Photo of the Day GalleryPhotography

Ourmazd, A., Fuoss, P.H., Bevk, J., Morar, J.F. (1990) The Si(001)/SiO2 interface. Applied Surface Science, 41. 365-371 doi:10.1016/0169-4332(89)90086-x

Advanced
   -   Only viewable:
Reference TypeJournal (article/letter/editorial)
TitleThe Si(001)/SiO2 interface
JournalApplied Surface Science
AuthorsOurmazd, A.Author
Fuoss, P.H.Author
Bevk, J.Author
Morar, J.F.Author
Year1990 (January)Volume41
PublisherElsevier BV
DOIdoi:10.1016/0169-4332(89)90086-xSearch in ResearchGate
Generate Citation Formats
Mindat Ref. ID9894956Long-form Identifiermindat:1:5:9894956:0
GUID0
Full ReferenceOurmazd, A., Fuoss, P.H., Bevk, J., Morar, J.F. (1990) The Si(001)/SiO2 interface. Applied Surface Science, 41. 365-371 doi:10.1016/0169-4332(89)90086-x
Plain TextOurmazd, A., Fuoss, P.H., Bevk, J., Morar, J.F. (1990) The Si(001)/SiO2 interface. Applied Surface Science, 41. 365-371 doi:10.1016/0169-4332(89)90086-x
In(n.d.) Applied Surface Science Vol. 41. Elsevier BV

See Also

These are possibly similar items as determined by title/reference text matching only.

Morar, J.F., Karlsson, U.O., Uhrberg, R.I.G., Kanski, J., Nilsson, P.O., Qu, H. (1990) Angle-resolved photoemission study of the As/Ge(100) interface. Applied Surface Science, 41. 312-316 doi:10.1016/0169-4332(89)90077-9
Akatsu, Hiroyuki, Ohdomari, Iwao (1990) HRTEM observation of the Si/SiO2 interface. Applied Surface Science, 41. 357-364 doi:10.1016/0169-4332(89)90085-8
Kamiura, Y., Hashimoto, F., Iwami, M. (1990) Iron accumulation at the Si-SiO2 interface and possible reduction of SiO2. Applied Surface Science, 41. 447-450 doi:10.1016/0169-4332(89)90101-3
Fujimura, Norifumi, Ito, Taichiro (1990) TiSi2 formation at the Ti-rich TiNx/Si interface. Applied Surface Science, 41. 272-276 doi:10.1016/0169-4332(89)90069-x
Hiraki, Akio (1990) Preface. Applied Surface Science, 41. doi:10.1016/0169-4332(89)90024-x
Yokota, Katsuhiro, Ohtsuki, Koichi, Ochi, Masatoshi, Ishihara, Shinji, Kimura, Itsuro (1990) Accumulation of implanted arsenic at the interface during annealing on thermally oxidized Si and SiO2 covered Si. Applied Surface Science, 41. 411-415 doi:10.1016/0169-4332(89)90093-7
Renaud, G., Fuoss, P. H., Ourmazd, A., Bevk, J., Freer, B. S., Hahn, P. O. (1991) Native oxidation of the Si(001) surface: Evidence for an interfacial phase. Applied Physics Letters, 58 (10). 1044-1046 doi:10.1063/1.104418
Renda, M., Morita, K. (1990) Epitaxial growth of a mono-crystalline metastable AuIn layer at the Au/InP(001) interface. Applied Surface Science, 41. 216-222 doi:10.1016/0169-4332(89)90060-3
Fujimura, Norifumi, Tachibana, Shoji, Ito, Taichiro (1990) Characterization of Si-Rich WSix on Si. Applied Surface Science, 41. 286-289 doi:10.1016/0169-4332(89)90072-x
Kosowsky, S.D., Hsu, C.-H., Pershan, P.S., Bevk, J., Freer, B.S. (1995) An X-ray scattering study of SiOx/Si/Ge(001). Applied Surface Science, 84. 179-185 doi:10.1016/0169-4332(94)00475-7
Bollu, M., Koch, F., Madenach, A., Scholz, J. (1987) Electrical switching and noise spectrum of Si-SiO2 interface defects generated by hot electrons. Applied Surface Science, 30. 142-147 doi:10.1016/0169-4332(87)90086-9
 
and/or  
Mindat.org is an outreach project of the Hudson Institute of Mineralogy, a 501(c)(3) not-for-profit organization.
Copyright © mindat.org and the Hudson Institute of Mineralogy 1993-2025, except where stated. Most political location boundaries are © OpenStreetMap contributors. Mindat.org relies on the contributions of thousands of members and supporters. Founded in 2000 by Jolyon Ralph.
To cite: Ralph, J., Von Bargen, D., Martynov, P., Zhang, J., Que, X., Prabhu, A., Morrison, S. M., Li, W., Chen, W., & Ma, X. (2025). Mindat.org: The open access mineralogy database to accelerate data-intensive geoscience research. American Mineralogist, 110(6), 833–844. doi:10.2138/am-2024-9486.
Privacy Policy - Terms & Conditions - Contact Us / DMCA issues - Report a bug/vulnerability Current server date and time: September 17, 2025 08:36:03
Go to top of page