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Sokolov, N.S., Alvarez, J.C., Shusterman, Yu.V., Yakovlev, N.L., Overney, R.M., Itoh, Y., Takahashi, I., Harada, J. (1996) Structural transformations at interfaces. Applied Surface Science, 104. 402-408 doi:10.1016/s0169-4332(96)00178-x

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Reference TypeJournal (article/letter/editorial)
TitleStructural transformations at interfaces
JournalApplied Surface Science
AuthorsSokolov, N.S.Author
Alvarez, J.C.Author
Shusterman, Yu.V.Author
Yakovlev, N.L.Author
Overney, R.M.Author
Itoh, Y.Author
Takahashi, I.Author
Harada, J.Author
Year1996 (September)Volume104
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(96)00178-xSearch in ResearchGate
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Mindat Ref. ID9898776Long-form Identifiermindat:1:5:9898776:4
GUID0
Full ReferenceSokolov, N.S., Alvarez, J.C., Shusterman, Yu.V., Yakovlev, N.L., Overney, R.M., Itoh, Y., Takahashi, I., Harada, J. (1996) Structural transformations at interfaces. Applied Surface Science, 104. 402-408 doi:10.1016/s0169-4332(96)00178-x
Plain TextSokolov, N.S., Alvarez, J.C., Shusterman, Yu.V., Yakovlev, N.L., Overney, R.M., Itoh, Y., Takahashi, I., Harada, J. (1996) Structural transformations at interfaces. Applied Surface Science, 104. 402-408 doi:10.1016/s0169-4332(96)00178-x
In(n.d.) Applied Surface Science Vol. 104. Elsevier BV

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Sokolov, N.S., Alvarez, J.C., Gastev, S.V., Shusterman, Yu.V., Takahashi, I., Itoh, Y., Harada, J., Overney, R.M. (1996) High quality CaF2 layers on Si(111) with type-A epitaxial relation at the interface. Journal of Crystal Growth, 169 (1). 40-50 doi:10.1016/0022-0248(96)00346-6
Harada, J., Takahashi, I., Itoh, Y., Sokolov, N.S., Yakovlev, N.L., Shusterman, Y., Alvarez, J.C. (1996) X-ray scattering from surfaces and interfaces and its application to the characterization of CaF2Si(111) interfaces. Journal of Crystal Growth, 163 (1). 31-38 doi:10.1016/0022-0248(95)01035-1
Harada, J., Itoh, Y., Shimura, T., Takahashi, I., Alvarez, J.C., Sokolov, N.S. (1994) X-ray crystal truncation rod scattering from MBE grown (CaF2-SrF2)/Si(111) superlattices. Applied Surface Science, 75. 263-268 doi:10.1016/0169-4332(94)90169-4
Lee, B.C., Khilko, A.Yu., Shusterman, Yu.V., Yakovlev, N.L., Sokolov, N.S., Kyutt, R.N., Suturin, S.M., Schowalter, L.J. (1998) Structural and electrical characterization of epitaxial CdF2 layers grown on Si(111) and CaF2(111) substrates. Applied Surface Science, 123. 590-594 doi:10.1016/s0169-4332(97)00574-6
Yakovlev, N.L, Shusterman, Yu.V, Maksym, P.A (1998) Hydrogen terminated Si(111) surface studied by RHEED. Applied Surface Science, 130. 310-313 doi:10.1016/s0169-4332(98)00076-2
Sokolov, N.S, Takeda, Y, Banshchikov, A.G, Harada, J, Inaba, K, Ofuchi, H, Tabuchi, M, Yakovlev, N.L (2000) MBE-growth of novel MnF2–CaF2 superlattices on Si(111) and their characterization. Applied Surface Science, 162. 469-473 doi:10.1016/s0169-4332(00)00235-x
Sokolov, N.S., Alvarez, J.C., Yakovlev, N.L. (1992) Fluoride layers and superlattices grown by MBE on Si(111): dynamic RHEED and Sm2+ photoluminescence studies. Applied Surface Science, 60. 421-425 doi:10.1016/0169-4332(92)90454-6
Izumi, A., Kawabata, K., Tsutsui, K., Sokolov, N.S., Novikov, S.V., Khilko, A.Yu. (1996) Growth of heterostructure with abrupt interfaces by using thin CaF2 buffer layer. Applied Surface Science, 104. 417-421 doi:10.1016/s0169-4332(96)00180-8
Itoh, Y., Takahashi, I., Ichimiya, A., Harada, J., Sokolov, N.S. (1996) Structure of long interface. Journal of Crystal Growth, 166 (1). 61-66 doi:10.1016/0022-0248(95)00517-x
Shusterman, Y.V, Yakovlev, N.L, Schowalter, L.J (2001) Ultra-thin epitaxial Al and Cu films on CaF2/Si(1 1 1). Applied Surface Science, 175. 27-32 doi:10.1016/s0169-4332(01)00033-2
Ofuchi, H, Tabuchi, M, Banshchikov, A.G, Sokolov, N.S, Yakovlev, N.L, Takeda, Y (2000) Fluorescence EXAFS study on local structures around Mn atoms in MnF2–CaF2 superlattices and double hetero-structures on Si(111). Applied Surface Science, 159. 220-224 doi:10.1016/s0169-4332(00)00105-7
 
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