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Izumi, A., Kawabata, K., Tsutsui, K., Sokolov, N.S., Novikov, S.V., Khilko, A.Yu. (1996) Growth of heterostructure with abrupt interfaces by using thin CaF2 buffer layer. Applied Surface Science, 104. 417-421 doi:10.1016/s0169-4332(96)00180-8

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Reference TypeJournal (article/letter/editorial)
TitleGrowth of heterostructure with abrupt interfaces by using thin CaF2 buffer layer
JournalApplied Surface Science
AuthorsIzumi, A.Author
Kawabata, K.Author
Tsutsui, K.Author
Sokolov, N.S.Author
Novikov, S.V.Author
Khilko, A.Yu.Author
Year1996 (September)Volume104
PublisherElsevier BV
DOIdoi:10.1016/s0169-4332(96)00180-8Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID9898778Long-form Identifiermindat:1:5:9898778:2
GUID0
Full ReferenceIzumi, A., Kawabata, K., Tsutsui, K., Sokolov, N.S., Novikov, S.V., Khilko, A.Yu. (1996) Growth of heterostructure with abrupt interfaces by using thin CaF2 buffer layer. Applied Surface Science, 104. 417-421 doi:10.1016/s0169-4332(96)00180-8
Plain TextIzumi, A., Kawabata, K., Tsutsui, K., Sokolov, N.S., Novikov, S.V., Khilko, A.Yu. (1996) Growth of heterostructure with abrupt interfaces by using thin CaF2 buffer layer. Applied Surface Science, 104. 417-421 doi:10.1016/s0169-4332(96)00180-8
In(n.d.) Applied Surface Science Vol. 104. Elsevier BV

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Izumi, A., Tsutsui, K., Sokolov, N.S., Faleev, N.N., Gastev, S.V., Novikov, S.V., Yakovlev, N.L. (1995) High-quality CdF2 layer growth on CaF2/Si(111). Journal of Crystal Growth, 150. 1115-1118 doi:10.1016/0022-0248(95)80112-p
Khilko, A.Yu., Gastev, S.V., Kyutt, R.N., Zamoryanskaya, M.V., Sokolov, N.S. (1998) Structural and luminescence studies of CdF2CaF2 superlattices on Si(111). Applied Surface Science, 123. 595-598 doi:10.1016/s0169-4332(97)00575-8
Kaminski, A.Yu., Suris, R.A. (1996) Smoothing of crystal surfaces during growth interruption. Applied Surface Science, 104. 312-316 doi:10.1016/s0169-4332(96)00163-8
Lee, B.C., Khilko, A.Yu., Shusterman, Yu.V., Yakovlev, N.L., Sokolov, N.S., Kyutt, R.N., Suturin, S.M., Schowalter, L.J. (1998) Structural and electrical characterization of epitaxial CdF2 layers grown on Si(111) and CaF2(111) substrates. Applied Surface Science, 123. 590-594 doi:10.1016/s0169-4332(97)00574-6
Sokolov, N.S., Alvarez, J.C., Shusterman, Yu.V., Yakovlev, N.L., Overney, R.M., Itoh, Y., Takahashi, I., Harada, J. (1996) Structural transformations at interfaces. Applied Surface Science, 104. 402-408 doi:10.1016/s0169-4332(96)00178-x
Hwang, S.M., Izumi, A., Tsutsui, K., Furukawa, S. (1994) Surface modification of CaF2 in atomic layer scale by electron beam exposure. Applied Surface Science, 82. 523-527 doi:10.1016/0169-4332(94)90268-2
Suturin, S.M., Basun, S.A., Gastev, S.V., Langer, J.M., Meltzer, R.S., Sokolov, N.S. (2000) Optical detection of electron transfer through interfaces in CaF2:Eu–CdF2 SLs. Applied Surface Science, 162. 474-478 doi:10.1016/s0169-4332(00)00236-1
Sokolov, N.S, Gastev, S.V, Khilko, A.Yu, Kyutt, R.N, Suturin, S.M, Zamoryanskaya, M.V (1999) CdF2–CaF2 superlattices on Si(111): MBE growth, structural and luminescence studies. Journal of Crystal Growth, 201. 1053-1056 doi:10.1016/s0022-0248(98)01515-2
Lew, A.Y., Yan, C.H., Tu, C.W., Yu, E.T. (1996) Characterization of arsenide/phosphide heterostructure interfaces by scanning tunneling microscopy. Applied Surface Science, 104. 522-528 doi:10.1016/s0169-4332(96)00197-3
Kim, B.M., Ventrice, C.A., Mercer, T., Overney, R., Schowalter, L.J. (1996) Molecular beam epitaxial growth of thin CaF2 films on vicinal Si(111) surfaces. Applied Surface Science, 104. 409-416 doi:10.1016/s0169-4332(96)00179-1
(1996) Author index. Applied Surface Science, 104. 690-698 doi:10.1016/s0169-4332(96)92258-8
 
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