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Tien, Chuen-Lin, Lyu, You-Ru, Jyu, Shiao-Shan (2008) Surface flatness of optical thin films evaluated by gray level co-occurrence matrix and entropy. Applied Surface Science, 254. 4762-4767 doi:10.1016/j.apsusc.2008.01.088

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Reference TypeJournal (article/letter/editorial)
TitleSurface flatness of optical thin films evaluated by gray level co-occurrence matrix and entropy
JournalApplied Surface Science
AuthorsTien, Chuen-LinAuthor
Lyu, You-RuAuthor
Jyu, Shiao-ShanAuthor
Year2008 (May)Volume254
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2008.01.088Search in ResearchGate
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Mindat Ref. ID9911230Long-form Identifiermindat:1:5:9911230:3
GUID0
Full ReferenceTien, Chuen-Lin, Lyu, You-Ru, Jyu, Shiao-Shan (2008) Surface flatness of optical thin films evaluated by gray level co-occurrence matrix and entropy. Applied Surface Science, 254. 4762-4767 doi:10.1016/j.apsusc.2008.01.088
Plain TextTien, Chuen-Lin, Lyu, You-Ru, Jyu, Shiao-Shan (2008) Surface flatness of optical thin films evaluated by gray level co-occurrence matrix and entropy. Applied Surface Science, 254. 4762-4767 doi:10.1016/j.apsusc.2008.01.088
In(n.d.) Applied Surface Science Vol. 254. Elsevier BV

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