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Gao, A., Zoethout, E., Sturm, J.M., Lee, C.J., Bijkerk, F. (2014) Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317. 745-751 doi:10.1016/j.apsusc.2014.08.177

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Reference TypeJournal (article/letter/editorial)
TitleDefect formation in single layer graphene under extreme ultraviolet irradiation
JournalApplied Surface Science
AuthorsGao, A.Author
Zoethout, E.Author
Sturm, J.M.Author
Lee, C.J.Author
Bijkerk, F.Author
Year2014 (October)Volume317
PublisherElsevier BV
DOIdoi:10.1016/j.apsusc.2014.08.177Search in ResearchGate
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Mindat Ref. ID9923901Long-form Identifiermindat:1:5:9923901:7
GUID0
Full ReferenceGao, A., Zoethout, E., Sturm, J.M., Lee, C.J., Bijkerk, F. (2014) Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317. 745-751 doi:10.1016/j.apsusc.2014.08.177
Plain TextGao, A., Zoethout, E., Sturm, J.M., Lee, C.J., Bijkerk, F. (2014) Defect formation in single layer graphene under extreme ultraviolet irradiation. Applied Surface Science, 317. 745-751 doi:10.1016/j.apsusc.2014.08.177
In(n.d.) Applied Surface Science Vol. 317. Elsevier BV

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Mund, B.K., Sturm, J.M., Lee, C.J., Bijkerk, F. (2018) Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light. Applied Surface Science, 427. 1033-1040 doi:10.1016/j.apsusc.2017.09.098
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