Reference Type | Journal (article/letter/editorial) |
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Title | TEM damage studies and electrical profile measurements of Si+ implanted GaAs |
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Journal | Physica B+C |
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Authors | Stewart, C.P. | Author |
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Blunt, R.T. | Author |
Booker, G.R. | Author |
Sanders, I.R. | Author |
Year | 1983 (February) | Volume | 116 |
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Issue | 1 |
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Publisher | Elsevier BV |
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DOI | doi:10.1016/0378-4363(83)90319-4Search in ResearchGate |
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| Generate Citation Formats |
Mindat Ref. ID | 5132324 | Long-form Identifier | mindat:1:5:5132324:4 |
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GUID | 0 |
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Full Reference | Stewart, C.P., Blunt, R.T., Booker, G.R., Sanders, I.R. (1983) TEM damage studies and electrical profile measurements of Si+ implanted GaAs. Physica B+C, 116 (1). 635-640 doi:10.1016/0378-4363(83)90319-4 |
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Plain Text | Stewart, C.P., Blunt, R.T., Booker, G.R., Sanders, I.R. (1983) TEM damage studies and electrical profile measurements of Si+ implanted GaAs. Physica B+C, 116 (1). 635-640 doi:10.1016/0378-4363(83)90319-4 |
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In | (1983, February) Physica B+C Vol. 116 (1) Elsevier BV |
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