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Vallet, M., Barbot, J. F., Oliviero, E., Donnelly, S. E., Hinks, J. A., Beaufort, M. F. (2014) In situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply. Journal of Applied Physics, 115 (22). 223515pp. doi:10.1063/1.4883766

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Reference TypeJournal (article/letter/editorial)
TitleIn situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply
JournalJournal of Applied Physics
AuthorsVallet, M.Author
Barbot, J. F.Author
Oliviero, E.Author
Donnelly, S. E.Author
Hinks, J. A.Author
Beaufort, M. F.Author
Year2014 (June 14)Volume115
Issue22
PublisherAIP Publishing
DOIdoi:10.1063/1.4883766Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID5197847Long-form Identifiermindat:1:5:5197847:9
GUID0
Full ReferenceVallet, M., Barbot, J. F., Oliviero, E., Donnelly, S. E., Hinks, J. A., Beaufort, M. F. (2014) In situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply. Journal of Applied Physics, 115 (22). 223515pp. doi:10.1063/1.4883766
Plain TextVallet, M., Barbot, J. F., Oliviero, E., Donnelly, S. E., Hinks, J. A., Beaufort, M. F. (2014) In situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply. Journal of Applied Physics, 115 (22). 223515pp. doi:10.1063/1.4883766
In(2014, June) Journal of Applied Physics Vol. 115 (22) AIP Publishing

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Beaufort, M.-F., Vallet, M., Nicolaï, J., Oliviero, E., Barbot, J.-F. (2015) In-situ evolution of helium bubbles in SiC under irradiation. Journal of Applied Physics, 118 (20). 205904pp. doi:10.1063/1.4936562
Pawley, C J, Beaufort, M F, Oliviero, E, Hinks, J A, Barbot, J F, Donnelly, S E (2012) Anin-situTEM investigation of He bubble evolution in SiC. Journal of Physics: Conference Series, 371. 12052pp. doi:10.1088/1742-6596/371/1/012052
Oliviero, E., Peripolli, S., Amaral, L., Fichtner, P. F. P., Beaufort, M. F., Barbot, J. F., Donnelly, S. E. (2006) Damage accumulation in neon implanted silicon. Journal of Applied Physics, 100 (4). 43505pp. doi:10.1063/1.2220644
Oliviero, E., Beaufort, M. F., Barbot, J. F. (2001) Dislocations induced by bubble formation in high energy He implantation in silicon. Journal of Applied Physics, 89 (10). 5332-5338 doi:10.1063/1.1327289
Reboh, S., Barbot, J. F., Vallet, M., Beaufort, M. F., Rieutord, F., Mazen, F., Cherkashin, N., Fichtner, P. F. P., Grilhé, J. (2013) Nanoscale organization by elastic interactions between H and He platelets in Si. Journal of Applied Physics, 114 (7). 73517pp. doi:10.1063/1.4818812
Vallet, M., Barbot, J. F., Declémy, A., Reboh, S., Beaufort, M. F. (2013) Effect of the substrate orientation on the formation of He-plates in Si. Journal of Applied Physics, 114 (19). 193501pp. doi:10.1063/1.4831659
Oliviero, E., Beaufort, M. F., Barbot, J. F. (2001) Influence of dose rate on bubble formation by high energy He implantation in silicon. Journal of Applied Physics, 90 (4). 1718-1724 doi:10.1063/1.1385576
Oliviero, E., David, M. L., Beaufort, M. F., Nomgaudyte, J., Pranevicius, L., Declémy, A., Barbot, J. F. (2002) Formation of bubbles by high dose He implantation in 4H–SiC. Journal of Applied Physics, 91 (3). 1179-1186 doi:10.1063/1.1429760
Oliviero, E., Beaufort, M. F., Barbot, J. F., van Veen, A., Fedorov, A. V. (2003) Helium implantation defects in SiC: A thermal helium desorption spectrometry investigation. Journal of Applied Physics, 93 (1). 231-238 doi:10.1063/1.1527974
Reboh, S, Barbot, J F, Beaufort, M F, Fitchner, P F P (2011) Propagation and interactions of cracks in Si induced by H supply into He-filled cracks. Journal of Physics: Conference Series, 281. 12022pp. doi:10.1088/1742-6596/281/1/012022
Oliviero, E., David, M. L., Beaufort, M. F., Barbot, J. F., van Veen, A. (2002) On the effects of implantation temperature in helium implanted silicon. Applied Physics Letters, 81 (22). 4201-4203 doi:10.1063/1.1525059
 
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