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Pawley, C J, Beaufort, M F, Oliviero, E, Hinks, J A, Barbot, J F, Donnelly, S E (2012) Anin-situTEM investigation of He bubble evolution in SiC. Journal of Physics: Conference Series, 371. 12052pp. doi:10.1088/1742-6596/371/1/012052

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Reference TypeJournal (article/letter/editorial)
TitleAnin-situTEM investigation of He bubble evolution in SiC
JournalJournal of Physics: Conference Series
AuthorsPawley, C JAuthor
Beaufort, M FAuthor
Oliviero, EAuthor
Hinks, J AAuthor
Barbot, J FAuthor
Donnelly, S EAuthor
Year2012 (July 2)Volume371
PublisherIOP Publishing
DOIdoi:10.1088/1742-6596/371/1/012052Search in ResearchGate
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Mindat Ref. ID5239105Long-form Identifiermindat:1:5:5239105:7
GUID0
Full ReferencePawley, C J, Beaufort, M F, Oliviero, E, Hinks, J A, Barbot, J F, Donnelly, S E (2012) Anin-situTEM investigation of He bubble evolution in SiC. Journal of Physics: Conference Series, 371. 12052pp. doi:10.1088/1742-6596/371/1/012052
Plain TextPawley, C J, Beaufort, M F, Oliviero, E, Hinks, J A, Barbot, J F, Donnelly, S E (2012) Anin-situTEM investigation of He bubble evolution in SiC. Journal of Physics: Conference Series, 371. 12052pp. doi:10.1088/1742-6596/371/1/012052
In(2012) Journal of Physics: Conference Series Vol. 371. IOP Publishing

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Donnelly, S E, Hinks, J A, Pawley, C J, Abrams, K J, van den Berg, J A (2012) Anin-situTEM study of the effects of 6 keV He ion irradiation on Si and SiO2. Journal of Physics: Conference Series, 371. 12045pp. doi:10.1088/1742-6596/371/1/012045
Vallet, M., Barbot, J. F., Oliviero, E., Donnelly, S. E., Hinks, J. A., Beaufort, M. F. (2014) In situ growth and coalescence of He-filled bi-dimensional defects in Si by H supply. Journal of Applied Physics, 115 (22). 223515pp. doi:10.1063/1.4883766
Hinks, J A, Jones, A N, Theodosiou, A, van den Berg, J A, Donnelly, S E (2012) Transmission Electron Microscopy Study of Graphite underin situIon Irradiation. Journal of Physics: Conference Series, 371. 12046pp. doi:10.1088/1742-6596/371/1/012046
Darnbrough, J E, Mahalingam, S, Flewitt, P E J (2012) Investigation of anomalous grains in polynanocrystalline nickel. Journal of Physics: Conference Series, 371. 12076pp. doi:10.1088/1742-6596/371/1/012076
Beaufort, M.-F., Vallet, M., Nicolaï, J., Oliviero, E., Barbot, J.-F. (2015) In-situ evolution of helium bubbles in SiC under irradiation. Journal of Applied Physics, 118 (20). 205904pp. doi:10.1063/1.4936562
Jiang, C, Declémy, A, Beaufort, M-F, Boulle, A, Barbot, J-F (2019) Effect of temperature on Xe implantation-induced damage in 4H-SiC. Journal of Physics: Conference Series, 1190. 12015pp. doi:10.1088/1742-6596/1190/1/012015
Oliviero, E., Beaufort, M. F., Barbot, J. F. (2001) Dislocations induced by bubble formation in high energy He implantation in silicon. Journal of Applied Physics, 89 (10). 5332-5338 doi:10.1063/1.1327289
Oliviero, E., Peripolli, S., Amaral, L., Fichtner, P. F. P., Beaufort, M. F., Barbot, J. F., Donnelly, S. E. (2006) Damage accumulation in neon implanted silicon. Journal of Applied Physics, 100 (4). 43505pp. doi:10.1063/1.2220644
Oliviero, E., Beaufort, M. F., Barbot, J. F., van Veen, A., Fedorov, A. V. (2003) Helium implantation defects in SiC: A thermal helium desorption spectrometry investigation. Journal of Applied Physics, 93 (1). 231-238 doi:10.1063/1.1527974
Oliviero, E., Beaufort, M. F., Barbot, J. F. (2001) Influence of dose rate on bubble formation by high energy He implantation in silicon. Journal of Applied Physics, 90 (4). 1718-1724 doi:10.1063/1.1385576
Oliviero, E., David, M. L., Beaufort, M. F., Nomgaudyte, J., Pranevicius, L., Declémy, A., Barbot, J. F. (2002) Formation of bubbles by high dose He implantation in 4H–SiC. Journal of Applied Physics, 91 (3). 1179-1186 doi:10.1063/1.1429760
 
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