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Dai, Chong-Chong, Liu, Xue-Chao, Zhou, Tian-Yu, Zhuo, Shi-Yi, Shi, Biao, Shi, Er-Wei (2014) Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C—SiC. Chinese Physics B, 23. 66803pp. doi:10.1088/1674-1056/23/6/066803

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Reference TypeJournal (article/letter/editorial)
TitleEffects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C—SiC
JournalChinese Physics B
AuthorsDai, Chong-ChongAuthor
Liu, Xue-ChaoAuthor
Zhou, Tian-YuAuthor
Zhuo, Shi-YiAuthor
Shi, BiaoAuthor
Shi, Er-WeiAuthor
Year2014 (June)Volume23
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/23/6/066803Search in ResearchGate
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Mindat Ref. ID6005094Long-form Identifiermindat:1:5:6005094:2
GUID0
Full ReferenceDai, Chong-Chong, Liu, Xue-Chao, Zhou, Tian-Yu, Zhuo, Shi-Yi, Shi, Biao, Shi, Er-Wei (2014) Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C—SiC. Chinese Physics B, 23. 66803pp. doi:10.1088/1674-1056/23/6/066803
Plain TextDai, Chong-Chong, Liu, Xue-Chao, Zhou, Tian-Yu, Zhuo, Shi-Yi, Shi, Biao, Shi, Er-Wei (2014) Effects of annealing temperature on the electrical property and microstructure of aluminum contact on n-type 3C—SiC. Chinese Physics B, 23. 66803pp. doi:10.1088/1674-1056/23/6/066803
In(n.d.) Chinese Physics B Vol. 23. IOP Publishing

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