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Zhou, Tian-Yu, Liu, Xue-Chao, Huang, Wei, Zhuo, Shi-Yi, Zheng, Yan-Qing, Shi, Er-Wei (2015) Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC. Chinese Physics B, 24. 126801pp. doi:10.1088/1674-1056/24/12/126801

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Reference TypeJournal (article/letter/editorial)
TitleElectrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC
JournalChinese Physics B
AuthorsZhou, Tian-YuAuthor
Liu, Xue-ChaoAuthor
Huang, WeiAuthor
Zhuo, Shi-YiAuthor
Zheng, Yan-QingAuthor
Shi, Er-WeiAuthor
Year2015 (December)Volume24
PublisherIOP Publishing
DOIdoi:10.1088/1674-1056/24/12/126801Search in ResearchGate
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Mindat Ref. ID6005810Long-form Identifiermindat:1:5:6005810:2
GUID0
Full ReferenceZhou, Tian-Yu, Liu, Xue-Chao, Huang, Wei, Zhuo, Shi-Yi, Zheng, Yan-Qing, Shi, Er-Wei (2015) Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC. Chinese Physics B, 24. 126801pp. doi:10.1088/1674-1056/24/12/126801
Plain TextZhou, Tian-Yu, Liu, Xue-Chao, Huang, Wei, Zhuo, Shi-Yi, Zheng, Yan-Qing, Shi, Er-Wei (2015) Electrical properties and microstructural characterization of Ni/Ta contacts to n-type 6H–SiC. Chinese Physics B, 24. 126801pp. doi:10.1088/1674-1056/24/12/126801
In(n.d.) Chinese Physics B Vol. 24. IOP Publishing

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