Edon, V., Li, Z., Hugon, M.-C., Agius, B., Krug, C., Baumvol, I. J. R., Durand, O., Eypert, C. (2007) Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks. Applied Physics Letters, 90 (12). 122905pp. doi:10.1063/1.2715112
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks | ||
Journal | Applied Physics Letters | ||
Authors | Edon, V. | Author | |
Li, Z. | Author | ||
Hugon, M.-C. | Author | ||
Agius, B. | Author | ||
Krug, C. | Author | ||
Baumvol, I. J. R. | Author | ||
Durand, O. | Author | ||
Eypert, C. | Author | ||
Year | 2007 (March 19) | Volume | 90 |
Issue | 12 | ||
Publisher | AIP Publishing | ||
DOI | doi:10.1063/1.2715112Search in ResearchGate | ||
Generate Citation Formats | |||
Mindat Ref. ID | 8553004 | Long-form Identifier | mindat:1:5:8553004:3 |
GUID | 0 | ||
Full Reference | Edon, V., Li, Z., Hugon, M.-C., Agius, B., Krug, C., Baumvol, I. J. R., Durand, O., Eypert, C. (2007) Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks. Applied Physics Letters, 90 (12). 122905pp. doi:10.1063/1.2715112 | ||
Plain Text | Edon, V., Li, Z., Hugon, M.-C., Agius, B., Krug, C., Baumvol, I. J. R., Durand, O., Eypert, C. (2007) Electrical characteristics and interface structure of HfAlO∕SiON∕Si(001) stacks. Applied Physics Letters, 90 (12). 122905pp. doi:10.1063/1.2715112 | ||
In | (2007, March) Applied Physics Letters Vol. 90 (12) AIP Publishing |
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