Reference Type | Journal (article/letter/editorial) |
---|
Title | Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films |
---|
Journal | Applied Physics Letters |
---|
Authors | Van Bockstael, C. | Author |
---|
De Keyser, K. | Author |
Van Meirhaeghe, R. L. | Author |
Detavernier, C. | Author |
Jordan-Sweet, J. L. | Author |
Lavoie, C. | Author |
Year | 2009 (January 19) | Volume | 94 |
---|
Issue | 3 |
---|
Publisher | AIP Publishing |
---|
DOI | doi:10.1063/1.3073750Search in ResearchGate |
---|
| Generate Citation Formats |
Mindat Ref. ID | 8575487 | Long-form Identifier | mindat:1:5:8575487:4 |
---|
|
GUID | 0 |
---|
Full Reference | Van Bockstael, C., De Keyser, K., Van Meirhaeghe, R. L., Detavernier, C., Jordan-Sweet, J. L., Lavoie, C. (2009) Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films. Applied Physics Letters, 94 (3). 33504pp. doi:10.1063/1.3073750 |
---|
Plain Text | Van Bockstael, C., De Keyser, K., Van Meirhaeghe, R. L., Detavernier, C., Jordan-Sweet, J. L., Lavoie, C. (2009) Influence of a transient hexagonal phase on the microstructure and morphological stability of NiSi films. Applied Physics Letters, 94 (3). 33504pp. doi:10.1063/1.3073750 |
---|
In | (2009, January) Applied Physics Letters Vol. 94 (3) AIP Publishing |
---|
These are possibly similar items as determined by title/reference text matching only.